Inventor
BESINGA GARY F
US42 patents
Patents
42 patentsUS9921898B1Mar 20, 2018
Identifying asynchronous power loss
MICRON TECHNOLOGY INC22 citations94
US10199111B1Feb 5, 2019
Memory devices with read level calibration
MICRON TECHNOLOGY INC30 citations93
US10593412B2Mar 17, 2020
Using a status indicator in a memory sub-system to detect an event
MICRON TECHNOLOGY INC5 citations84
US10529433B1Jan 7, 2020
Offset memory component automatic calibration (AUTOCAL) error recovery for a memory sub-system
MICRON TECHNOLOGY INC10 citations84
US10366763B2Jul 30, 2019
Block read count voltage adjustment
MICRON TECHNOLOGY INC4 citations84
US11715530B2Aug 1, 2023
Offset memory component automatic calibration (autocal) error recovery for a memory sub-system
MICRON TECHNOLOGY INC2 citations73
US11456051B1Sep 27, 2022
Optimized storage charge loss management
MICRON TECHNOLOGY INC2 citations73
US11361833B2Jun 14, 2022
Offset memory component automatic calibration (autocal) error recovery for a memory subsystem
MICRON TECHNOLOGY INC2 citations73
US11158392B2Oct 26, 2021
Operation of mixed mode blocks
MICRON TECHNOLOGY INC2 citations73
US11031089B2Jun 8, 2021
Block read count voltage adjustment
MICRON TECHNOLOGY INC2 citations73
US10942796B2Mar 9, 2021
Identifying asynchronous power loss
MICRON TECHNOLOGY INC3 citations73
US10915395B2Feb 9, 2021
Read retry with targeted auto read calibrate
MICRON TECHNOLOGY INC2 citations73
US10854305B2Dec 1, 2020
Using a status indicator in a memory sub-system to detect an event
MICRON TECHNOLOGY INC1 citations73
US10755792B2Aug 25, 2020
Block read count voltage adjustment
MICRON TECHNOLOGY INC2 citations73
US10579307B2Mar 3, 2020
Correcting power loss in NAND memory devices
MICRON TECHNOLOGY INC2 citations73
US10573357B2Feb 25, 2020
Optimized scan interval
MICRON TECHNOLOGY INC2 citations73
US10446197B2Oct 15, 2019
Optimized scan interval
MICRON TECHNOLOGY INC2 citations73
US10340016B2Jul 2, 2019
Methods of error-based read disturb mitigation and memory devices utilizing the same
MICRON TECHNOLOGY INC2 citations73
US10325668B2Jun 18, 2019
Operation of mixed mode blocks
MICRON TECHNOLOGY INC2 citations73
US10303535B2May 28, 2019
Identifying asynchronous power loss
MICRON TECHNOLOGY INC3 citations73
US11507304B1Nov 22, 2022
Diagonal page mapping in memory systems
MICRON TECHNOLOGY INC2 citations72
US11393548B2Jul 19, 2022
Workload adaptive scans for memory sub-systems
MICRON TECHNOLOGY INC2 citations72
US10430116B2Oct 1, 2019
Correcting power loss in NAND memory devices
MICRON TECHNOLOGY INC2 citations72
US12353753B2Jul 8, 2025
Diagonal page mapping in memory systems
MICRON TECHNOLOGY INC0 citations62
US11984174B2May 14, 2024
Accelerating configuration updates for memory devices
MICRON TECHNOLOGY INC0 citations62
US11923030B2Mar 5, 2024
Optimized storage charge loss management
MICRON TECHNOLOGY INC0 citations62
US11721404B2Aug 8, 2023
Operation of mixed mode blocks
MICRON TECHNOLOGY INC0 citations62
US11720259B2Aug 8, 2023
Selective dummy writes for asynchronous power loss handling in memory devices
MICRON TECHNOLOGY INC0 citations62
US11715541B2Aug 1, 2023
Workload adaptive scans for memory sub-systems
MICRON TECHNOLOGY INC0 citations62
US11687452B2Jun 27, 2023
Dynamic program-verify voltage adjustment for intra-block storage charge loss uniformity
MICRON TECHNOLOGY INC1 citations62
US11456037B2Sep 27, 2022
Block read count voltage adjustment
MICRON TECHNOLOGY INC0 citations62
US11120885B2Sep 14, 2021
Using a status indicator in a memory sub-system to detect an event
MICRON TECHNOLOGY INC0 citations62
US11056156B2Jul 6, 2021
Optimized scan interval
MICRON TECHNOLOGY INC0 citations62
US10770156B2Sep 8, 2020
Memory devices and methods for read disturb mitigation involving word line scans to detect localized read disturb effects and to determine error count in tracked sub sets of memory addresses
MICRON TECHNOLOGY INC1 citations62
US10510422B2Dec 17, 2019
Memory devices with read level calibration
MICRON TECHNOLOGY INC1 citations62
US11644979B2May 9, 2023
Selective accelerated sampling of failure- sensitive memory pages
MICRON TECHNOLOGY INC0 citations61
US11301143B2Apr 12, 2022
Selective accelerated sampling of failure-sensitive memory pages
MICRON TECHNOLOGY INC0 citations61
US12119068B2Oct 15, 2024
Program continuation strategies after memory device power loss
MICRON TECHNOLOGY INC0 citations52
US11715531B2Aug 1, 2023
Open block management using storage charge loss margin checking
MICRON TECHNOLOGY INC0 citations52
US11126495B2Sep 21, 2021
Dynamic error handling in a memory system
MICRON TECHNOLOGY INC0 citations52
US10430262B2Oct 1, 2019
Identifying asynchronous power loss
MICRON TECHNOLOGY INC0 citations52
US12451209B2Oct 21, 2025
Error handling
MICRON TECHNOLOGY INC0 citations49