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Inventor
TAKEBUCHI RYUICHI
JP
3 patents
⚠️ This page may combine multiple inventors who share the name “TAKEBUCHI RYUICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO ELECTRON LTD
2 patents
US5124931A
Jun 23, 1992
Method of inspecting electric characteristics of wafers and apparatus therefor
TOKYO ELECTRON LTD
21 citations
77
US4966520A
Oct 30, 1990
Method of positioning objects to be measured
TOKYO ELECTRON LTD
18 citations
71
TEL YAMANISHI KK
1 patent
US5321352A
Jun 14, 1994
Probe apparatus and method of alignment for the same
TEL YAMANISHI KK
170 citations
94