Inventor
CHEONG KWANG-YUNG
KR4 patents
Patents
4 patentsUS6055463AApr 25, 2000
Control system and method for semiconductor integrated circuit test process
SAMSUNG ELECTRONICS CO LTD120 citations95
US6223098B1Apr 24, 2001
Control system for semiconductor integrated circuit test process
SAMSUNG ELECTRONICS CO LTD39 citations89
US7514949B2Apr 7, 2009
Testing method detecting localized failure on a semiconductor wafer
SAMSUNG ELECTRONICS CO LTD7 citations67
US7094615B2Aug 22, 2006
Method of controlling probe tip sanding in semiconductor device testing equipment
SAMSUNG ELECTRONICS CO LTD1 citations47