Inventor
FOSSEY MICHAEL E
US12 patents
⚠️ This page may combine multiple inventors who share the name “FOSSEY MICHAEL E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADE OPTICAL SYST CORP
5 patentsUS6118525ASep 12, 2000
Wafer inspection system for distinguishing pits and particles
ADE OPTICAL SYST CORP122 citations97
US5712701AJan 27, 1998
Surface inspection system and method of inspecting surface of workpiece
ADE OPTICAL SYST CORP164 citations97
US6509965B2Jan 21, 2003
Wafer inspection system for distinguishing pits and particles
ADE OPTICAL SYST CORP38 citations95
US5988971ANov 23, 1999
Wafer transfer robot
ADE OPTICAL SYST CORP87 citations91
US6122047ASep 19, 2000
Methods and apparatus for identifying the material of a particle occurring on the surface of a substrate
ADE OPTICAL SYST CORP37 citations90
MAX VIZ INC
2 patentsUS7705879B2Apr 27, 2010
System for and method of synchronous acquisition of pulsed source light in performance of monitoring aircraft flight operation
MAX VIZ INC35 citations87
USRE45452EApr 7, 2015
System for and method of synchronous acquisition of pulsed source light in performance of monitoring aircraft flight operation
MAX VIZ INC4 citations68