Inventor
ELYASAF EMANUEL
IL23 patents
⚠️ This page may combine multiple inventors who share the name “ELYASAF EMANUEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
11 patentsUS6175645B1Jan 16, 2001
Optical inspection method and apparatus
APPLIED MATERIALS INC175 citations99
US6369888B1Apr 9, 2002
Method and apparatus for article inspection including speckle reduction
APPLIED MATERIALS INC118 citations98
US6268093B1Jul 31, 2001
Method for reticle inspection using aerial imaging
APPLIED MATERIALS INC205 citations98
US7133548B2Nov 7, 2006
Method and apparatus for reticle inspection using aerial imaging
APPLIED MATERIALS INC53 citations96
US6809808B2Oct 26, 2004
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC23 citations92
US6798505B2Sep 28, 2004
Method and apparatus for article inspection including speckle reduction
APPLIED MATERIALS INC20 citations92
US6587194B2Jul 1, 2003
Method of and apparatus for article inspection including speckle reduction
APPLIED MATERIALS INC19 citations92
US6429931B1Aug 6, 2002
Method and apparatus for article inspection including speckle reduction
APPLIED MATERIALS INC20 citations92
US7053395B2May 30, 2006
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC10 citations73
US6853475B2Feb 8, 2005
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC11 citations73
US6556294B2Apr 29, 2003
Method of and apparatus for article inspection including speckle reduction
APPLIED MATERIALS INC6 citations73
APPLIED MATERIALS ISRAEL LTD
10 patentsUS7619203B2Nov 17, 2009
High throughput multi beam detection system and method
APPLIED MATERIALS ISRAEL LTD28 citations92
US7355690B2Apr 8, 2008
Double inspection of reticle or wafer
APPLIED MATERIALS ISRAEL LTD22 citations92
US7504622B2Mar 17, 2009
High throughput multi beam detection system and method
APPLIED MATERIALS ISRAEL LTD34 citations91
US7187439B2Mar 6, 2007
High throughput inspection system and method for generating transmitted and/or reflected images
APPLIED MATERIALS ISRAEL LTD11 citations81
US6930770B2Aug 16, 2005
High throughput inspection system and method for generating transmitted and/or reflected images
APPLIED MATERIALS ISRAEL LTD9 citations71
US7400390B2Jul 15, 2008
Inspection system and a method for aerial reticle inspection
APPLIED MATERIALS ISRAEL LTD3 citations61
US7841529B2Nov 30, 2010
Multiple optical head inspection system and a method for imaging an article
APPLIED MATERIALS ISRAEL LTD1 citations52
US7601944B2Oct 13, 2009
High throughput multi beam detection system and method
APPLIED MATERIALS ISRAEL LTD0 citations52
US7326901B2Feb 5, 2008
High throughput multi beam system and method
APPLIED MATERIALS ISRAEL LTD0 citations52
US7518718B2Apr 14, 2009
High throughput inspection system and a method for generating transmitted and/or reflected images
APPLIED MATERIALS ISRAEL LTD0 citations49