Inventor
WAGMAN ADAM
US39 patents
⚠️ This page may combine multiple inventors who share the name “WAGMAN ADAM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
COGNEX CORP
22 patentsUS6850646B1Feb 1, 2005
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP77 citations98
US6798925B1Sep 28, 2004
Method and apparatus for calibrating an image acquisition system
COGNEX CORP82 citations98
US6658145B1Dec 2, 2003
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP120 citations98
US7016539B1Mar 21, 2006
Method for fast, robust, multi-dimensional pattern recognition
COGNEX CORP121 citations97
US6836567B1Dec 28, 2004
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP70 citations97
US7088862B1Aug 8, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP24 citations96
US7065262B1Jun 20, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP29 citations96
US6856698B1Feb 15, 2005
Fast high-accuracy multi-dimensional pattern localization
COGNEX CORP64 citations96
US8363972B1Jan 29, 2013
Method for fast, robust, multi-dimensional pattern recognition
COGNEX CORP19 citations95
US7164796B1Jan 16, 2007
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP13 citations93
US7043081B1May 9, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP13 citations93
US7006712B1Feb 28, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP13 citations93
US6993192B1Jan 31, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP11 citations93
US6985625B1Jan 10, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP12 citations93
US6751361B1Jun 15, 2004
Method and apparatus for performing fixturing in a machine vision system
COGNEX CORP47 citations93
US8363956B1Jan 29, 2013
Method for fast, robust, multi-dimensional pattern recognition
COGNEX CORP9 citations92
US7251366B1Jul 31, 2007
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP18 citations89
US10452949B2Oct 22, 2019
System and method for scoring clutter for use in 3D point cloud matching in a vision system
COGNEX CORP8 citations82
US7058225B1Jun 6, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP6 citations74
US10957072B2Mar 23, 2021
System and method for simultaneous consideration of edges and normals in image features by a vision system
COGNEX CORP2 citations72
US10482621B2Nov 19, 2019
System and method for improved scoring of 3D poses and spurious point removal in 3D image data
COGNEX CORP3 citations71
US11881000B2Jan 23, 2024
System and method for simultaneous consideration of edges and normals in image features by a vision system
COGNEX CORP0 citations62
SILVER WILLIAM M
7 patentsUS8229222B1Jul 24, 2012
Method for fast, robust, multi-dimensional pattern recognition
SILVER WILLIAM M30 citations95
US8270748B1Sep 18, 2012
Method for fast, robust, multi-dimensional pattern recognition
SILVER WILLIAM M10 citations93
US8335380B1Dec 18, 2012
Method for fast, robust, multi-dimensional pattern recognition
SILVER WILLIAM M7 citations92
US8320675B1Nov 27, 2012
Method for fast, robust, multi-dimensional pattern recognition
SILVER WILLIAM M7 citations92
US8295613B1Oct 23, 2012
Method for fast, robust, multi-dimensional pattern recognition
SILVER WILLIAM M8 citations92
US8254695B1Aug 28, 2012
Method for fast, robust, multi-dimensional pattern recognition
SILVER WILLIAM M9 citations92
US8867847B2Oct 21, 2014
Method for fast, robust, multi-dimensional pattern recognition
SILVER WILLIAM M3 citations74
COGNEX TECH & INVESTMENT CORP
6 patentsUS7162073B1Jan 9, 2007
Methods and apparatuses for detecting classifying and measuring spot defects in an image of an object
COGNEX TECH & INVESTMENT CORP127 citations97
US7181066B1Feb 20, 2007
Method for locating bar codes and symbols in an image
COGNEX TECH & INVESTMENT CORP104 citations96
US8363942B1Jan 29, 2013
Method for fast, robust, multi-dimensional pattern recognition
COGNEX TECH & INVESTMENT CORP11 citations93
US6975764B1Dec 13, 2005
Fast high-accuracy multi-dimensional pattern inspection
COGNEX TECH & INVESTMENT CORP14 citations93
US6959112B1Oct 25, 2005
Method for finding a pattern which may fall partially outside an image
COGNEX TECH & INVESTMENT CORP34 citations93
US6798515B1Sep 28, 2004
Method for calculating a scale relationship for an imaging system
COGNEX TECH & INVESTMENT CORP29 citations93