Inventor
AKIYAMA TATSUO
JP23 patents
⚠️ This page may combine multiple inventors who share the name “AKIYAMA TATSUO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
14 patentsUS5643046AJul 1, 1997
Polishing method and apparatus for detecting a polishing end point of a semiconductor wafer
TOSHIBA KK207 citations98
US4710794ADec 1, 1987
Composite semiconductor device
TOSHIBA KK78 citations96
US4729966AMar 8, 1988
Process for manufacturing a Schottky FET device using metal sidewalls as gates
TOSHIBA KK29 citations92
US5229323AJul 20, 1993
Method for manufacturing a semiconductor device with Schottky electrodes
TOSHIBA KK23 citations91
US7702413B2Apr 20, 2010
Semiconductor device manufacturing system and method for manufacturing semiconductor devices including calculating oxide film thickness using real time simulator
TOSHIBA KK22 citations90
US4532004AJul 30, 1985
Method of manufacturing a semiconductor device
TOSHIBA KK26 citations82
US7272460B2Sep 18, 2007
Method for designing a manufacturing process, method for providing manufacturing process design and technology computer-aided design system
TOSHIBA KK9 citations73
US5031021AJul 9, 1991
Semiconductor device with a high breakdown voltage
TOSHIBA KK14 citations73
US5049954ASep 17, 1991
GaAs field effect semiconductor device having Schottky gate structure
TOSHIBA KK10 citations72
US4700455AOct 20, 1987
Method of fabricating Schottky gate-type GaAs field effect transistor
TOSHIBA KK7 citations72
US5260603ANov 9, 1993
Electrode structure of semiconductor device for use in GaAs compound substrate
TOSHIBA KK12 citations70
US5374835ADec 20, 1994
Field effect transistor using compound semiconductor
TOSHIBA KK11 citations69
US6775816B2Aug 10, 2004
Semiconductor design/fabrication system, semiconductor design/fabrication method and semiconductor design/fabrication program
TOSHIBA KK2 citations62
US6657735B2Dec 2, 2003
Method of evaluating critical locations on a semiconductor apparatus pattern
TOSHIBA KK3 citations61
NEC CORP
5 patentsUS10867394B2Dec 15, 2020
Object tracking device, object tracking method, and recording medium
NEC CORP3 citations73
US11494922B2Nov 8, 2022
Object tracking device, object tracking method, and object tracking program
NEC CORP0 citations62
US11341739B2May 24, 2022
Image processing device, image processing method, and program recording medium
NEC CORP0 citations62
US9830336B2Nov 28, 2017
Information processing device, information processing method and information processing program
NEC CORP0 citations52
US9836665B2Dec 5, 2017
Management system, list production device, method, computer readable recording medium, data structure, and printed label
NEC CORP0 citations41
AKIYAMA TATSUO
3 patentsUS8520981B2Aug 27, 2013
Document retrieval of feature point groups using a geometrical transformation
AKIYAMA TATSUO4 citations60
US8199970B2Jun 12, 2012
Moving amount calculation system and obstacle detection system
AKIYAMA TATSUO2 citations60
US9430711B2Aug 30, 2016
Feature point matching device, feature point matching method, and non-transitory computer readable medium storing feature matching program
AKIYAMA TATSUO0 citations39