Inventor · disambiguated record

Dean M. Dahlgnist

Also filed as: DAHLGNIST DEAN M

1 granted patent·2 citations·filing 2002–2002

19Inventor score

Technology areasH10P

Files withDELPHI TECH INC1

Top patents by PatentIndex Score

1 record

0141US6836134B2Apparatus and method for determining leakage current between a first semiconductor region and a second semiconductor region to be formed thereinDELPHI TECH INC·Filed 2002·Granted Dec 28, 2004·2 cites·16 claims

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