Inventor
NAFTALI RON
IL47 patents
⚠️ This page may combine multiple inventors who share the name “NAFTALI RON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
23 patentsUS7468506B2Dec 23, 2008
Spot grid array scanning system
APPLIED MATERIALS ISRAEL LTD55 citations96
US7468507B2Dec 23, 2008
Optical spot grid array scanning system
APPLIED MATERIALS ISRAEL LTD37 citations91
US7030978B2Apr 18, 2006
System and method for inspection of a substrate that has a refractive index
APPLIED MATERIALS ISRAEL LTD17 citations84
US7428850B2Sep 30, 2008
Integrated in situ scanning electronic microscope review station in semiconductor wafers and photomasks optical inspection system
APPLIED MATERIALS ISRAEL LTD8 citations71
US10811219B2Oct 20, 2020
Method for evaluating a region of an object
APPLIED MATERIALS ISRAEL LTD3 citations65
US7924419B2Apr 12, 2011
Illumination system for optical inspection
APPLIED MATERIALS ISRAEL LTD3 citations63
US7973919B2Jul 5, 2011
High resolution wafer inspection system
APPLIED MATERIALS ISRAEL LTD3 citations61
US12566143B2Mar 3, 2026
Optical inspection systems with pulsed light sources and pulse multiplexing
APPLIED MATERIALS ISRAEL LTD0 citations60
US11803961B2Oct 31, 2023
Die-to-multi-die wafer inspection
APPLIED MATERIALS ISRAEL LTD0 citations56
US6831736B2Dec 14, 2004
Method of and apparatus for line alignment to compensate for static and dynamic inaccuracies in scanning
APPLIED MATERIALS ISRAEL LTD5 citations56
US12436401B2Oct 7, 2025
Polarization optical system
APPLIED MATERIALS ISRAEL LTD0 citations52
US11177048B2Nov 16, 2021
Method and system for evaluating objects
APPLIED MATERIALS ISRAEL LTD0 citations51
US7714999B2May 11, 2010
High resolution wafer inspection system
APPLIED MATERIALS ISRAEL LTD0 citations51
US12362131B2Jul 15, 2025
Method for inspecting a specimen and charged particle beam device
APPLIED MATERIALS ISRAEL LTD0 citations50
US10060736B1Aug 28, 2018
Near-field sensor height control
APPLIED MATERIALS ISRAEL LTD0 citations50
US9835563B2Dec 5, 2017
Evaluation system and a method for evaluating a substrate
APPLIED MATERIALS ISRAEL LTD0 citations49
US10068748B2Sep 4, 2018
Scanning an object using multiple mechanical stages
APPLIED MATERIALS ISRAEL LTD0 citations48
US9997328B2Jun 12, 2018
System and method for forming a sealed chamber
APPLIED MATERIALS ISRAEL LTD1 citations47
US7498557B2Mar 3, 2009
Cascaded image intensifier
APPLIED MATERIALS ISRAEL LTD1 citations45
US10054551B2Aug 21, 2018
Inspection system and method for inspecting a sample by using a plurality of spaced apart beams
APPLIED MATERIALS ISRAEL LTD0 citations41
US9297692B2Mar 29, 2016
System and method for inspecting a sample using landing lens
APPLIED MATERIALS ISRAEL LTD0 citations41
US9784689B2Oct 10, 2017
Method and system for inspecting an object with an array of beams
APPLIED MATERIALS ISRAEL LTD0 citations40
US10446434B2Oct 15, 2019
Chuck for supporting a wafer
APPLIED MATERIALS ISRAEL LTD0 citations39
APPLIED MATERIALS INC
21 patentsUS6124924ASep 26, 2000
Focus error correction method and apparatus
APPLIED MATERIALS INC73 citations94
US7630069B2Dec 8, 2009
Illumination system for optical inspection
APPLIED MATERIALS INC27 citations92
US6882417B2Apr 19, 2005
Method and system for detecting defects
APPLIED MATERIALS INC25 citations92
US6861660B2Mar 1, 2005
Process and assembly for non-destructive surface inspection
APPLIED MATERIALS INC22 citations92
US6809808B2Oct 26, 2004
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC23 citations92
US6657714B2Dec 2, 2003
Defect detection with enhanced dynamic range
APPLIED MATERIALS INC43 citations92
US6366352B1Apr 2, 2002
Optical inspection method and apparatus utilizing a variable angle design
APPLIED MATERIALS INC32 citations92
US7109463B2Sep 19, 2006
Amplifier circuit with a switching device to provide a wide dynamic output range
APPLIED MATERIALS INC17 citations84
US6914670B1Jul 5, 2005
Defect detection with enhanced dynamic range
APPLIED MATERIALS INC7 citations74
US7460221B2Dec 2, 2008
Method and system for detecting defects
APPLIED MATERIALS INC5 citations73
US7173694B2Feb 6, 2007
Method and system for detecting defects
APPLIED MATERIALS INC9 citations73
US7053395B2May 30, 2006
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC10 citations73
US7053999B2May 30, 2006
Method and system for detecting defects
APPLIED MATERIALS INC10 citations73
US6853475B2Feb 8, 2005
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC11 citations73
US6469784B2Oct 22, 2002
Optical inspection method and apparatus utilizing a variable angle design
APPLIED MATERIALS INC7 citations73
US7184612B2Feb 27, 2007
Hardware configuration for parallel data processing without cross communication
APPLIED MATERIALS INC9 citations71
US6898304B2May 24, 2005
Hardware configuration for parallel data processing without cross communication
APPLIED MATERIALS INC9 citations71
US7268343B2Sep 11, 2007
Method and system for detecting defects
APPLIED MATERIALS INC3 citations62
US10421125B2Sep 24, 2019
Controlling an intensity profile of an energy beam in additive manufacturing based on travel direction or velocity
APPLIED MATERIALS INC0 citations52
US10307822B2Jun 4, 2019
Controlling an intensity profile of an energy beam with a deformable mirror in additive manufacturing
APPLIED MATERIALS INC0 citations52
US7463351B2Dec 9, 2008
Process and assembly for non-destructive surface inspection
APPLIED MATERIALS INC0 citations52