Inventor
PFEIFFER DIRK
US105 patents
⚠️ This page may combine multiple inventors who share the name “PFEIFFER DIRK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
40 patentsUS6730454B2May 4, 2004
Antireflective SiO-containing compositions for hardmask layer
IBM112 citations98
US7179758B2Feb 20, 2007
Recovery of hydrophobicity of low-k and ultra low-k organosilicate films used as inter metal dielectrics
IBM50 citations96
US6806026B2Oct 19, 2004
Photoresist composition
IBM62 citations95
US9096050B2Aug 4, 2015
Wafer scale epitaxial graphene transfer
IBM34 citations94
US9059188B1Jun 16, 2015
Graphene resistor based tamper resistant identifier with contactless reading
IBM31 citations94
US8971527B2Mar 3, 2015
Reliable physical unclonable function for device authentication
IBM35 citations94
US9088278B2Jul 21, 2015
Physical unclonable function generation and management
IBM19 citations93
US8816717B2Aug 26, 2014
Reactive material for integrated circuit tamper detection and response
IBM26 citations93
US7541134B2Jun 2, 2009
Antireflective film-forming composition, method for manufacturing the same, and antireflective film and pattern formation method using the same
IBM34 citations93
US7141692B2Nov 28, 2006
Molecular photoresists containing nonpolymeric silsesquioxanes
IBM19 citations93
US6803660B1Oct 12, 2004
Patterning layers comprised of spin-on ceramic films
IBM19 citations93
US7435074B2Oct 14, 2008
Method for fabricating dual damascence structures using photo-imprint lithography, methods for fabricating imprint lithography molds for dual damascene structures, materials for imprintable dielectrics and equipment for photo-imprint lithography used in dual damascence patterning
IBM13 citations92
US7030008B2Apr 18, 2006
Techniques for patterning features in semiconductor devices
IBM14 citations91
US7270931B2Sep 18, 2007
Silicon-containing compositions for spin-on ARC/hardmask materials
IBM15 citations90
US10423805B2Sep 24, 2019
Encryption engine with an undetectable/tamper-proof private key in late node CMOS technology
IBM5 citations84
US9660806B2May 23, 2017
Carbon nanotube array for cryptographic key generation and protection
IBM6 citations84
US9184751B2Nov 10, 2015
Physical unclonable function generation and management
IBM8 citations84
US8861728B2Oct 14, 2014
Integrated circuit tamper detection and response
IBM12 citations84
US8860176B2Oct 14, 2014
Multi-doped silicon antifuse device for integrated circuit
IBM6 citations84
US8828762B2Sep 9, 2014
Carbon nanostructure device fabrication utilizing protect layers
IBM10 citations84
US8766258B1Jul 1, 2014
Authentication using graphene based devices as physical unclonable functions
IBM7 citations84
US7982312B2Jul 19, 2011
Method for fabricating dual damascene structures using photo-imprint lithography, methods for fabricating imprint lithography molds for dual damascene structures, materials for imprintable dielectrics and equipment for photo-imprint lithography used in dual damascene patterning
IBM10 citations84
US7687913B2Mar 30, 2010
Recovery of hydrophobicity of low-k and ultra low-k organosilicate films used as inter metal dielectrics
IBM10 citations84
US7326442B2Feb 5, 2008
Antireflective composition and process of making a lithographic structure
IBM11 citations84
US7223517B2May 29, 2007
Lithographic antireflective hardmask compositions and uses thereof
IBM14 citations84
US6780736B1Aug 24, 2004
Method for image reversal of implant resist using a single photolithography exposure and structures formed thereby
IBM16 citations84
US7588879B2Sep 15, 2009
Graded spin-on organic antireflective coating for photolithography
IBM15 citations83
US7172849B2Feb 6, 2007
Antireflective hardmask and uses thereof
IBM10 citations83
US7837459B2Nov 23, 2010
Method for fabricating dual damascene structures using photo-imprint lithography, methods for fabricating imprint lithography molds for dual damascene structures, materials for imprintable dielectrics and equipment for photo-imprint lithography used in dual damascene patterning
IBM5 citations74
US7776628B2Aug 17, 2010
Method and system for tone inverting of residual layer tolerant imprint lithography
IBM7 citations74
US7736841B2Jun 15, 2010
Reflective film interface to restore transverse magnetic wave contrast in lithographic processing
IBM4 citations74
US7470504B2Dec 30, 2008
Reflective film interface to restore transverse magnetic wave contrast in lithographic processing
IBM4 citations74
US7256146B2Aug 14, 2007
Method of forming a ceramic diffusion barrier layer
IBM5 citations74
US7187081B2Mar 6, 2007
Polycarbosilane buried etch stops in interconnect structures
IBM7 citations74
US7077903B2Jul 18, 2006
Etch selectivity enhancement for tunable etch resistant anti-reflective layer
IBM9 citations74
US6940173B2Sep 6, 2005
Interconnect structures incorporating low-k dielectric barrier films
IBM6 citations74
US6929982B2Aug 16, 2005
Patterning layers comprised of spin-on ceramic films
IBM7 citations74
US11587890B2Feb 21, 2023
Tamper-resistant circuit, back-end of the line memory and physical unclonable function for supply chain protection
IBM2 citations73
US11508438B1Nov 22, 2022
RRAM filament location based on NIR emission
IBM2 citations73
US11164190B2Nov 2, 2021
Method for product authentication using a microfluidic reader
IBM6 citations73
EDELSTEIN DANIEL C
2 patentsBONILLA GRISELDA
2 patentsBRULEY JOHN
1 patentGLOBALFOUNDRIES US 2 LLC
1 patentSAMSUNG ELECTRONICS CO LTD
1 patentSHINETSU CHEMICAL CO
1 patentBRUCE ROBERT L
1 patentGOLDFARB DARIO L
1 patentShowing the top 50 of 105 patents by PatentIndex Score.