P

Inventor

GLUSCHENKOV OLEG

US230 patents
⚠️ This page may combine multiple inventors who share the name “GLUSCHENKOV OLEG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

44 patents
US6977194B2Dec 20, 2005

Structure and method to improve channel mobility by gate electrode stress modification

IBM225 citations99
US9799736B1Oct 24, 2017

High acceptor level doping in silicon germanium

IBM420 citations98
US6720630B2Apr 13, 2004

Structure and method for MOSFET with metallic gate electrode

IBM122 citations98
US7247547B2Jul 24, 2007

Method of fabricating a field effect transistor having improved junctions

IBM57 citations96
US7138685B2Nov 21, 2006

Vertical MOSFET SRAM cell

IBM54 citations96
US7002209B2Feb 21, 2006

MOSFET structure with high mechanical stress in the channel

IBM61 citations96
US9773901B1Sep 26, 2017

Bottom spacer formation for vertical transistor

IBM43 citations94
US6930060B2Aug 16, 2005

Method for forming a uniform distribution of nitrogen in silicon oxynitride gate dielectric

IBM90 citations94
US9748382B1Aug 29, 2017

Self aligned top extension formation for vertical transistors

IBM13 citations93
US7394273B2Jul 1, 2008

On-chip electromigration monitoring system

IBM31 citations93
US7262087B2Aug 28, 2007

Dual stressed SOI substrates

IBM20 citations93
US7176116B2Feb 13, 2007

High performance FET with laterally thin extension

IBM17 citations93
US7084024B2Aug 1, 2006

Gate electrode forming methods using conductive hard mask

IBM40 citations93
US7026247B2Apr 11, 2006

Nanocircuit and self-correcting etching method for fabricating same

IBM21 citations93
US7023064B2Apr 4, 2006

Temperature stable metal nitride gate electrode

IBM32 citations93
US6982196B2Jan 3, 2006

Oxidation method for altering a film structure and CMOS transistor structure formed therewith

IBM27 citations93
US6806534B2Oct 19, 2004

Damascene method for improved MOS transistor

IBM35 citations93
US6544874B2Apr 8, 2003

Method for forming junction on insulator (JOI) structure

IBM48 citations93
US6509221B1Jan 21, 2003

Method for forming high performance CMOS devices with elevated sidewall spacers

IBM25 citations93
US9613870B2Apr 4, 2017

Gate stack formed with interrupted deposition processes and laser annealing

IBM13 citations92
US9613866B2Apr 4, 2017

Gate stack formed with interrupted deposition processes and laser annealing

IBM11 citations92
US9455185B1Sep 27, 2016

Laser anneal of buried metallic interconnects including through silicon vias

IBM16 citations92
US9449921B1Sep 20, 2016

Voidless contact metal structures

IBM17 citations92
US7585704B2Sep 8, 2009

Method of producing highly strained PECVD silicon nitride thin films at low temperature

IBM28 citations92
US7504700B2Mar 17, 2009

Method of forming an ultra-thin [[HfSiO]] metal silicate film for high performance CMOS applications and semiconductor structure formed in said method

IBM26 citations92
US7030012B2Apr 18, 2006

Method for manufacturing tungsten/polysilicon word line structure in vertical DRAM

IBM49 citations92
US6911384B2Jun 28, 2005

Gate structure with independently tailored vertical doping profile

IBM22 citations92
US6890833B2May 10, 2005

Trench isolation employing a doped oxide trench fill

IBM25 citations92
US6746933B1Jun 8, 2004

Pitcher-shaped active area for field effect transistor and method of forming same

IBM35 citations92
US6709926B2Mar 23, 2004

High performance logic and high density embedded dram with borderless contact and antispacer

IBM26 citations92
US6686637B1Feb 3, 2004

Gate structure with independently tailored vertical doping profile

IBM29 citations92
US6566210B2May 20, 2003

Method of improving gate activation by employing atomic oxygen enhanced oxidation

IBM35 citations92
US6451662B1Sep 17, 2002

Method of forming low-leakage on-chip capacitor

IBM47 citations92
US6444516B1Sep 3, 2002

Semi-insulating diffusion barrier for low-resistivity gate conductors

IBM31 citations92
US7160771B2Jan 9, 2007

Forming gate oxides having multiple thicknesses

IBM20 citations88
US6838334B1Jan 4, 2005

Method of fabricating a buried collar

IBM21 citations88
US10777468B1Sep 15, 2020

Stacked vertical field-effect transistors with sacrificial layer patterning

IBM14 citations86
US10692768B1Jun 23, 2020

Vertical transport field-effect transistor architecture

IBM13 citations86
US10658180B1May 19, 2020

EUV pattern transfer with ion implantation and reduced impact of resist residue

IBM6 citations84
US10079299B2Sep 18, 2018

Self aligned top extension formation for vertical transistors

IBM8 citations84
US9978750B1May 22, 2018

Low resistance source/drain contacts for complementary metal oxide semiconductor (CMOS) devices

IBM11 citations84
US9972682B2May 15, 2018

Low resistance source drain contact formation

IBM13 citations84
US9954103B1Apr 24, 2018

Bottom spacer formation for vertical transistor

IBM11 citations84
US9941391B2Apr 10, 2018

Method of forming vertical transistor having dual bottom spacers

IBM8 citations84

INFINEON TECHNOLOGIES AG

3 patents

LIU YAOCHENG

2 patents

GLUSCHENKOV OLEG

1 patent

Showing the top 50 of 230 patents by PatentIndex Score.