Inventor
MIYANO YUMIKO
JP15 patents
⚠️ This page may combine multiple inventors who share the name “MIYANO YUMIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
9 patentsUS6772089B2Aug 3, 2004
Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system
TOSHIBA KK29 citations92
US6647147B1Nov 11, 2003
Method for measuring fine pattern, apparatus for measuring fine pattern, and record medium that can store therein program to measure fine pattern and can be read by using computer
TOSHIBA KK36 citations92
US6480807B1Nov 12, 2002
Micropattern measuring method and apparatus, and recording medium that records micropattern measuring program
TOSHIBA KK32 citations92
US6363167B1Mar 26, 2002
Method for measuring size of fine pattern
TOSHIBA KK32 citations92
US7321680B2Jan 22, 2008
Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system
TOSHIBA KK11 citations84
US9831270B2Nov 28, 2017
Nonvolatile semiconductor memory device and method for manufacturing the same
TOSHIBA KK3 citations72
US7787687B2Aug 31, 2010
Pattern shape evaluation apparatus, pattern shape evaluation method, method of manufacturing semiconductor device, and program
TOSHIBA KK4 citations62
US6963819B2Nov 8, 2005
Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded
TOSHIBA KK4 citations62
US7418363B2Aug 26, 2008
Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded
TOSHIBA KK0 citations52