Inventor

MITSUI TADASHI

JP44 patents

⚠️ This page may combine multiple inventors who share the name “MITSUI TADASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUI TADASHI

TOSHIBA KK

Plurality of photolithographic alignment marks with shape, size and spacing based on circuit pattern features

Method for producing tips for atomic force microscopes

Charged particle detection device and charged particle radiation apparatus

Method and apparatus for measuring dimensions of a feature of a specimen

Photolithographic alignment marks based on circuit pattern feature

Pattern evaluation method, method of manufacturing semiconductor, program and pattern evaluation apparatus

Pattern evaluation method, pattern evaluation system and computer-readable recorded medium

Pattern evaluation method, pattern matching method and computer readable medium

Measurement system and method and computer program for processing measurement data

Pattern evaluation method, computer-readable medium, and semiconductor device manufacturing method

Pattern evaluation system, pattern evaluation method and program

Pattern measurement method, manufacturing method of semiconductor device, pattern measurement apparatus, and program

Pattern shape evaluation apparatus, pattern shape evaluation method, method of manufacturing semiconductor device, and program

Pattern evaluation system, pattern evaluation method and semiconductor device manufacturing method

Image processing apparatus, image processing method, defect detection method, semiconductor device manufacturing method, and program

Pattern edge detecting method and pattern evaluating method

Pattern matching method, program and semiconductor device manufacturing method

Pattern shape evaluation method and pattern shape evaluation apparatus utilizing the same

MITSUI TADASHI

Pattern inspection method and semiconductor device manufacturing method

Image processing apparatus, image processing method, defect detection method, semiconductor device manufacturing method, and program

Pattern measurement apparatus and pattern measurement method

Pattern misalignment measurement method, program, and semiconductor device manufacturing method

Pattern evaluation method, pattern matching method and computer readable medium

Defect inspection apparatus and defect inspection method

Pattern evaluation method, computer-readable recording medium, and manufacturing method of semiconductor device

Pattern defect inspection using data based on secondary electron from pattern

Pattern shape evaluation method, program, and semiconductor device manufacturing method

TDK CORP

Ferrite core

Inductance element

Surface-mounted-type inductance element

Ferrite core

Bobbin and magnetic core assembly

Bobbin for use with a magnetic core

TDK ELECTRONICS CO LTD

Ferrite core

Ferrite core

Transformer core member

NAT INST FOR MATERIALS SCIENCE

Method of manufacturing optical fiber probe and for finishing micro material

Methods for manufacturing optical fiber probe and for processing micromaterial

JAPAN SCIENCE & TECH AGENCY

Method for preparing functional nanomaterials utilizing endothermic reaction

Method for preparing functional nanomaterials utilizing endothermic reaction

TOKYO ELECTRON LTD

Handling apparatus for transferring a semiconductor wafer or LCD

IBM

Assembly for measuring a trench depth parameter of a workpiece

ANDO ELECTRIC

IC handler and contact cleaning method

MIYANO YUMIKO

Alignment of semiconductor wafer patterns by corresponding edge groups