Inventor
CARULLI JR JOHN M
US3 patents
Patents
3 patentsUS9714966B2Jul 25, 2017
Circuit aging sensor
TEXAS INSTRUMENTS INC31 citations92
US7292058B2Nov 6, 2007
Method for estimating the early failure rate of semiconductor devices
TEXAS INSTRUMENTS INC15 citations81
US7865849B2Jan 4, 2011
System and method for estimating test escapes in integrated circuits
TEXAS INSTRUMENTS INC2 citations56