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Inventor
LEE CHE-YEN
TW
2 patents
⚠️ This page may combine multiple inventors who share the name “LEE CHE-YEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
1 patent
US12196687B2
Jan 14, 2025
Method for inspecting pattern defects
TAIWAN SEMICONDUCTOR MFG CO LTD
1 citations
57
LEE CHE-YEN
1 patent
US8411142B2
Apr 2, 2013
Intellectual surveillance system and monitoring method thereof
LEE CHE-YEN
0 citations
27