Inventor
FEUDEL THOMAS
DE30 patents
⚠️ This page may combine multiple inventors who share the name “FEUDEL THOMAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
21 patentsUS7754556B2Jul 13, 2010
Reducing transistor junction capacitance by recessing drain and source regions
ADVANCED MICRO DEVICES INC18 citations92
US7208397B2Apr 24, 2007
Transistor having an asymmetric source/drain and halo implantation region and a method of forming the same
ADVANCED MICRO DEVICES INC23 citations92
US7955937B2Jun 7, 2011
Method for manufacturing semiconductor device comprising SOI transistors and bulk transistors
ADVANCED MICRO DEVICES INC7 citations84
US6846708B2Jan 25, 2005
Semiconductor device having improved doping profiles and a method of improving the doping profiles of a semiconductor device
ADVANCED MICRO DEVICES INC13 citations84
US6821840B2Nov 23, 2004
Semiconductor device including a field effect transistor and a passive capacitor having reduced leakage current and an improved capacitance per unit area
ADVANCED MICRO DEVICES INC13 citations84
US6821887B2Nov 23, 2004
Method of forming a metal silicide gate in a standard MOS process sequence
ADVANCED MICRO DEVICES INC18 citations84
US6808970B2Oct 26, 2004
Semiconductor device having an improved strained surface layer and method of forming a strained surface layer in a semiconductor device
ADVANCED MICRO DEVICES INC13 citations84
US6593175B2Jul 15, 2003
Method of controlling a shape of an oxide layer formed on a substrate
ADVANCED MICRO DEVICES INC16 citations84
US6897114B2May 24, 2005
Methods of forming a transistor having a recessed gate electrode structure
ADVANCED MICRO DEVICES INC13 citations83
US6849516B2Feb 1, 2005
Methods of forming drain/source extension structures of a field effect transistor using a doped high-k dielectric layer
ADVANCED MICRO DEVICES INC11 citations74
US6410410B1Jun 25, 2002
Method of forming lightly doped regions in a semiconductor device
ADVANCED MICRO DEVICES INC8 citations74
US7419867B2Sep 2, 2008
CMOS gate structure comprising predoped semiconductor gate material with improved uniformity of dopant distribution and method of forming the structure
ADVANCED MICRO DEVICES INC4 citations63
US7338872B2Mar 4, 2008
Method of depositing a layer of a material on a substrate
ADVANCED MICRO DEVICES INC2 citations63
US6924216B2Aug 2, 2005
Semiconductor device having improved doping profiles and method of improving the doping profiles of a semiconductor device
ADVANCED MICRO DEVICES INC5 citations63
US6822430B2Nov 23, 2004
Method of assessing lateral dopant and/or charge carrier profiles
ADVANCED MICRO DEVICES INC3 citations63
US6806153B2Oct 19, 2004
Method of manufacturing a field effect transistor
ADVANCED MICRO DEVICES INC5 citations63
US7745334B2Jun 29, 2010
Technique for locally adapting transistor characteristics by using advanced laser/flash anneal techniques
ADVANCED MICRO DEVICES INC4 citations62
US7494872B2Feb 24, 2009
Field effect transistor having a doped gate electrode with reduced gate depletion and method of forming the transistor
ADVANCED MICRO DEVICES INC3 citations62
US6905924B2Jun 14, 2005
Diode structure for SOI circuits
ADVANCED MICRO DEVICES INC3 citations62
US7625802B2Dec 1, 2009
Semiconductor device having improved halo structures and a method of forming the halo structures of a semiconductor device
ADVANCED MICRO DEVICES INC0 citations52
US7816199B2Oct 19, 2010
Method of forming a semiconductor structure comprising an implantation of ions of a non-doping element
ADVANCED MICRO DEVICES INC0 citations41
GLOBALFOUNDRIES INC
2 patentsUS7964970B2Jun 21, 2011
Technique for enhancing transistor performance by transistor specific contact design
GLOBALFOUNDRIES INC11 citations84
US7799682B2Sep 21, 2010
Transistor having a locally provided metal silicide region in contact areas and a method of forming the transistor
GLOBALFOUNDRIES INC12 citations84