Inventor

LEE JIH-SAN

TW2 patents

⚠️ This page may combine multiple inventors who share the name “LEE JIH-SAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KUO SUNG-NIEN

1 patent

US8283941B2Oct 9, 2012

Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluation

KUO SUNG-NIEN3 citations45

UNITED MICROELECTRONICS CORP

1 patent

US12588293B2Mar 24, 2026

Electrostatic discharge protection circuit using GaN-based devices

UNITED MICROELECTRONICS CORP0 citations41