Inventor

TOYODA YASUTAKA

JP63 patents

⚠️ This page may combine multiple inventors who share the name “TOYODA YASUTAKA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOYODA YASUTAKA

HITACHI HIGH TECH CORP

Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus

Pattern measurement apparatus

Method and apparatus of pattern inspection and semiconductor inspection system using the same

Pattern generating apparatus and pattern shape evaluating apparatus

Pattern shape evaluation method

Pattern matching apparatus and scanning electron microscope using the same

Pattern inspection apparatus and semiconductor inspection system

Pattern inspecting and measuring device and program

Pattern inspection system

Inspection apparatus using template matching method using similarity distribution

Method and apparatus for measuring three-dimensional shape of specimen by using SEM

Image evaluation method and image evaluation device

Pattern sensing device and semiconductor sensing system

Pattern inspection method and pattern inspection system

Dimension measuring apparatus and computer readable medium

Pattern inspection system

Exposure condition evaluation device

Pattern-measuring apparatus and semiconductor-measuring system

Pattern generating apparatus and pattern shape evaluating apparatus

Pattern generating apparatus and pattern shape evaluating apparatus

Pattern matching apparatus and semiconductor inspection system using the same

Training method for learning apparatus, and image generation system

Image processing system and computer program for performing image processing

Image processing system and computer program for performing image processing

Semiconductor measurement apparatus and computer program

Structure estimation system and structure estimation program for estimating height of structure based on data from charged particle beam device

Image recognition device and method

Pattern-measuring apparatus and semiconductor-measuring system

Image processing program, image processing device, and image processing method

Dimension measurement apparatus, dimension measurement program, and semiconductor manufacturing system

Method, apparatus, and program for determining condition related to captured image of charged particle beam apparatus

TOYODA YASUTAKA

Method and apparatus of pattern inspection and semiconductor inspection system using the same

Pattern generating apparatus and pattern shape evaluating apparatus

Pattern inspection method and pattern inspection system

Pattern inspection method, pattern inspection program, and electronic device inspection system

Method and apparatus of pattern inspection and semiconductor inspection system using the same

Image processing apparatus

HITACHI LTD

Image display system

Image formation apparatus

Image display system and image information transmission method

Image display system

Image formation apparatus

MATSUOKA RYOICHI

Pattern measurement apparatus

Method of creating template for matching, as well as device for creating template

RICOH PRINTING SYS LTD

Image signal processing method, image signal processing device, and image signal processing system

ABE YUICHI

Image inspection apparatus

MOROKUMA HIDETOSHI

Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus

TAKAYAMA ATSUSHI

Money handling machine, money handling system, money handling method and valuable-medium handling machine

SHINODA SHINICHI

Method and apparatus for image generation

GLORY KOGYO KK

Money handling machine and money handling system