Inventor
LOBASTOV VLADIMIR ANATOLIEVICH
US2 patents
Patents
2 patentsUS11413698B2Aug 16, 2022
System and method for monitoring and controlling build quality during electron beam manufacturing
GEN ELECTRIC2 citations67
US10502701B2Dec 10, 2019
Method and system using x-ray pinhole camera for in-situ monitoring of electron beam manufacturing process
GEN ELECTRIC1 citations58