P

Inventor

GEORGAKOS GEORG

DE27 patents
⚠️ This page may combine multiple inventors who share the name “GEORGAKOS GEORG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INFINEON TECHNOLOGIES AG

20 patents
US6844603B2Jan 18, 2005

Nonvolatile NOR two-transistor semiconductor memory cell and associated NOR semiconductor memory device and method for the fabrication thereof

INFINEON TECHNOLOGIES AG53 citations95
US6212102B1Apr 3, 2001

EEPROM and method for triggering the EEPROM

INFINEON TECHNOLOGIES AG83 citations95
US7471580B2Dec 30, 2008

Flip-flop with additional state storage in the event of turn-off

INFINEON TECHNOLOGIES AG24 citations92
US7411423B2Aug 12, 2008

Logic activation circuit

INFINEON TECHNOLOGIES AG11 citations84
US7027287B2Apr 11, 2006

Storage capacitor with high memory capacity and low surface area

INFINEON TECHNOLOGIES AG17 citations84
US7795669B2Sep 14, 2010

Contact structure for FinFET device

INFINEON TECHNOLOGIES AG18 citations81
US7177385B2Feb 13, 2007

Shift register for safely providing a configuration bit

INFINEON TECHNOLOGIES AG7 citations72
US11733288B2Aug 22, 2023

Circuits and techniques for assessing aging effects in semiconductor circuits

INFINEON TECHNOLOGIES AG3 citations71
US11609265B1Mar 21, 2023

End-of-life prediction for circuits using accelerated reliability models and sensor data

INFINEON TECHNOLOGIES AG2 citations71
US9424124B2Aug 23, 2016

Error-tolerant memories

INFINEON TECHNOLOGIES AG4 citations71
US6654281B2Nov 25, 2003

Nonvolatile nor semiconductor memory device and method for programming the memory device

INFINEON TECHNOLOGIES AG11 citations69
US7427882B2Sep 23, 2008

Method and apparatus for switching on a voltage supply of a semiconductor circuit and corresponding semiconductor circuit

INFINEON TECHNOLOGIES AG2 citations63
US11327835B2May 10, 2022

Devices and methods for data storage

INFINEON TECHNOLOGIES AG0 citations62
US12254254B2Mar 18, 2025

Circuits and techniques for predicting failure of circuits based on stress origination metrics and stress victim events

INFINEON TECHNOLOGIES AG0 citations61
US7685550B2Mar 23, 2010

Method for designing integrated circuits comprising replacement logic gates

INFINEON TECHNOLOGIES AG4 citations57
US7757109B2Jul 13, 2010

Circuit arrangement for activating a circuit block and method for the same

INFINEON TECHNOLOGIES AG0 citations51
US12352802B2Jul 8, 2025

Circuits and techniques for predicting end of life based on in situ monitors and limit values defined for the in situ monitors

INFINEON TECHNOLOGIES AG0 citations50
US11821935B2Nov 21, 2023

Differential aging monitor circuits and techniques for assessing aging effects in semiconductor circuits

INFINEON TECHNOLOGIES AG0 citations50
US7453125B1Nov 18, 2008

Double mesh finfet

INFINEON TECHNOLOGIES AG1 citations47
US7709962B2May 4, 2010

Layout structure having a fill element arranged at an angle to a conducting line

INFINEON TECHNOLOGIES AG0 citations45

SIEMENS AG

3 patents

GEORGAKOS GEORG

2 patents

PACHA CHRISTIAN

1 patent

BAUMANN THOMAS

1 patent