Inventor
GEORGAKOS GEORG
DE27 patents
⚠️ This page may combine multiple inventors who share the name “GEORGAKOS GEORG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
20 patentsUS6844603B2Jan 18, 2005
Nonvolatile NOR two-transistor semiconductor memory cell and associated NOR semiconductor memory device and method for the fabrication thereof
INFINEON TECHNOLOGIES AG53 citations95
US6212102B1Apr 3, 2001
EEPROM and method for triggering the EEPROM
INFINEON TECHNOLOGIES AG83 citations95
US7471580B2Dec 30, 2008
Flip-flop with additional state storage in the event of turn-off
INFINEON TECHNOLOGIES AG24 citations92
US7411423B2Aug 12, 2008
Logic activation circuit
INFINEON TECHNOLOGIES AG11 citations84
US7027287B2Apr 11, 2006
Storage capacitor with high memory capacity and low surface area
INFINEON TECHNOLOGIES AG17 citations84
US7795669B2Sep 14, 2010
Contact structure for FinFET device
INFINEON TECHNOLOGIES AG18 citations81
US7177385B2Feb 13, 2007
Shift register for safely providing a configuration bit
INFINEON TECHNOLOGIES AG7 citations72
US11733288B2Aug 22, 2023
Circuits and techniques for assessing aging effects in semiconductor circuits
INFINEON TECHNOLOGIES AG3 citations71
US11609265B1Mar 21, 2023
End-of-life prediction for circuits using accelerated reliability models and sensor data
INFINEON TECHNOLOGIES AG2 citations71
US9424124B2Aug 23, 2016
Error-tolerant memories
INFINEON TECHNOLOGIES AG4 citations71
US6654281B2Nov 25, 2003
Nonvolatile nor semiconductor memory device and method for programming the memory device
INFINEON TECHNOLOGIES AG11 citations69
US7427882B2Sep 23, 2008
Method and apparatus for switching on a voltage supply of a semiconductor circuit and corresponding semiconductor circuit
INFINEON TECHNOLOGIES AG2 citations63
US11327835B2May 10, 2022
Devices and methods for data storage
INFINEON TECHNOLOGIES AG0 citations62
US12254254B2Mar 18, 2025
Circuits and techniques for predicting failure of circuits based on stress origination metrics and stress victim events
INFINEON TECHNOLOGIES AG0 citations61
US7685550B2Mar 23, 2010
Method for designing integrated circuits comprising replacement logic gates
INFINEON TECHNOLOGIES AG4 citations57
US7757109B2Jul 13, 2010
Circuit arrangement for activating a circuit block and method for the same
INFINEON TECHNOLOGIES AG0 citations51
US12352802B2Jul 8, 2025
Circuits and techniques for predicting end of life based on in situ monitors and limit values defined for the in situ monitors
INFINEON TECHNOLOGIES AG0 citations50
US11821935B2Nov 21, 2023
Differential aging monitor circuits and techniques for assessing aging effects in semiconductor circuits
INFINEON TECHNOLOGIES AG0 citations50
US7453125B1Nov 18, 2008
Double mesh finfet
INFINEON TECHNOLOGIES AG1 citations47
US7709962B2May 4, 2010
Layout structure having a fill element arranged at an angle to a conducting line
INFINEON TECHNOLOGIES AG0 citations45
SIEMENS AG
3 patentsUS6034902AMar 7, 2000
Solid-state memory device
SIEMENS AG6 citations62
US5946249AAug 31, 1999
Circuit configuration for a programmable nonvolatile memory and method for operating the circuit configuration
SIEMENS AG1 citations51
US5703533ADec 30, 1997
BiCMOS operational amplifier for switch/capacitor circuits
SIEMENS AG1 citations51