P

Inventor

LAUER GEN P

US43 patents
⚠️ This page may combine multiple inventors who share the name “LAUER GEN P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

36 patents
US9450180B1Sep 20, 2016

Structure and method to reduce shorting in STT-MRAM device

IBM65 citations98
US9502640B1Nov 22, 2016

Structure and method to reduce shorting in STT-MRAM device

IBM25 citations94
US9705071B2Jul 11, 2017

Structure and method to reduce shorting and process degradation in STT-MRAM devices

IBM19 citations92
US9660179B1May 23, 2017

Enhanced coercivity in MTJ devices by contact depth control

IBM13 citations92
US10243138B2Mar 26, 2019

Structure and method to reduce shorting and process degradation in STT-MRAM devices

IBM7 citations84
US9812370B2Nov 7, 2017

III-V, SiGe, or Ge base lateral bipolar transistor and CMOS hybrid technology

IBM7 citations84
US9653679B1May 16, 2017

Magnetoresistive structures with stressed layer

IBM8 citations84
US9601686B1Mar 21, 2017

Magnetoresistive structures with stressed layer

IBM7 citations84
US9397287B1Jul 19, 2016

Magnetic tunnel junction with post-deposition hydrogenation

IBM16 citations84
US9391163B2Jul 12, 2016

Stacked planar double-gate lamellar field-effect transistor

IBM11 citations84
US9373638B1Jun 21, 2016

Complementary metal-oxide silicon having silicon and silicon germanium channels

IBM5 citations84
US9209095B2Dec 8, 2015

III-V, Ge, or SiGe fin base lateral bipolar transistor structure and method

IBM18 citations84
US9705077B2Jul 11, 2017

Spin torque MRAM fabrication using negative tone lithography and ion beam etching

IBM7 citations83
US9515252B1Dec 6, 2016

Low degradation MRAM encapsulation process using silicon-rich silicon nitride film

IBM13 citations83
US10256397B2Apr 9, 2019

Structure and method to reduce shorting and process degradation in stt-MRAM devices

IBM3 citations73
US10170608B2Jan 1, 2019

Internal spacer formation from selective oxidation for fin-first wire-last replacement gate-all-around nanowire FET

IBM2 citations73
US10170609B2Jan 1, 2019

Internal spacer formation from selective oxidation for Fin-first wire-last replacement gate-all-around nanowire FET

IBM4 citations73
US9960347B2May 1, 2018

Structure and method to reduce shorting and process degradation in STT-MRAM devices

IBM3 citations73
US9853210B2Dec 26, 2017

Reduced process degradation of spin torque magnetoresistive random access memory

IBM2 citations73
US9673386B2Jun 6, 2017

Structure and method to reduce shorting in STT-MRAM device

IBM2 citations73
US9496184B2Nov 15, 2016

III-V, SiGe, or Ge base lateral bipolar transistor and CMOS hybrid technology

IBM5 citations73
US10388857B2Aug 20, 2019

Spin torque MRAM fabrication using negative tone lithography and ion beam etching

IBM1 citations72
US10084127B2Sep 25, 2018

Enhanced coercivity in MTJ devices by contact depth control

IBM1 citations63
US9947863B2Apr 17, 2018

Structure and method to reduce shorting in STT-MRAM device

IBM1 citations63
US9543388B2Jan 10, 2017

Complementary metal-oxide silicon having silicon and silicon germanium channels

IBM1 citations63
US11011698B2May 18, 2021

Enhanced coercivity in MTJ devices by contact depth control

IBM0 citations62
US10497862B2Dec 3, 2019

Enhanced coercivity in MTJ devices by contact depth control

IBM0 citations52
US9954062B2Apr 24, 2018

Stacked planar double-gate lamellar field-effect transistor

IBM0 citations52
US9954063B2Apr 24, 2018

Stacked planar double-gate lamellar field-effect transistor

IBM0 citations52
US9859375B2Jan 2, 2018

Stacked planar double-gate lamellar field-effect transistor

IBM0 citations52
US9748310B2Aug 29, 2017

Structure and method to reduce shorting in STT-MRAM device

IBM0 citations52
US9691972B1Jun 27, 2017

Low temperature encapsulation for magnetic tunnel junction

IBM1 citations52
US9466673B2Oct 11, 2016

Complementary metal-oxide silicon having silicon and silicon germanium channels

IBM0 citations52
US8853662B2Oct 7, 2014

Self-aligned process to fabricate a memory cell array with a surrounding-gate access transistor

IBM0 citations52
US10170698B2Jan 1, 2019

Spin torque MRAM fabrication using negative tone lithography and ion beam etching

IBM0 citations51
US8927431B2Jan 6, 2015

High-rate chemical vapor etch of silicon substrates

IBM0 citations51

BRIGHTSKY MATTHEW J

5 patents

GLOBALFOUNDRIES INC

2 patents