Inventor
LAUER GEN P
US43 patents
⚠️ This page may combine multiple inventors who share the name “LAUER GEN P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
36 patentsUS9450180B1Sep 20, 2016
Structure and method to reduce shorting in STT-MRAM device
IBM65 citations98
US9502640B1Nov 22, 2016
Structure and method to reduce shorting in STT-MRAM device
IBM25 citations94
US9705071B2Jul 11, 2017
Structure and method to reduce shorting and process degradation in STT-MRAM devices
IBM19 citations92
US9660179B1May 23, 2017
Enhanced coercivity in MTJ devices by contact depth control
IBM13 citations92
US10243138B2Mar 26, 2019
Structure and method to reduce shorting and process degradation in STT-MRAM devices
IBM7 citations84
US9812370B2Nov 7, 2017
III-V, SiGe, or Ge base lateral bipolar transistor and CMOS hybrid technology
IBM7 citations84
US9653679B1May 16, 2017
Magnetoresistive structures with stressed layer
IBM8 citations84
US9601686B1Mar 21, 2017
Magnetoresistive structures with stressed layer
IBM7 citations84
US9397287B1Jul 19, 2016
Magnetic tunnel junction with post-deposition hydrogenation
IBM16 citations84
US9391163B2Jul 12, 2016
Stacked planar double-gate lamellar field-effect transistor
IBM11 citations84
US9373638B1Jun 21, 2016
Complementary metal-oxide silicon having silicon and silicon germanium channels
IBM5 citations84
US9209095B2Dec 8, 2015
III-V, Ge, or SiGe fin base lateral bipolar transistor structure and method
IBM18 citations84
US9705077B2Jul 11, 2017
Spin torque MRAM fabrication using negative tone lithography and ion beam etching
IBM7 citations83
US9515252B1Dec 6, 2016
Low degradation MRAM encapsulation process using silicon-rich silicon nitride film
IBM13 citations83
US10256397B2Apr 9, 2019
Structure and method to reduce shorting and process degradation in stt-MRAM devices
IBM3 citations73
US10170608B2Jan 1, 2019
Internal spacer formation from selective oxidation for fin-first wire-last replacement gate-all-around nanowire FET
IBM2 citations73
US10170609B2Jan 1, 2019
Internal spacer formation from selective oxidation for Fin-first wire-last replacement gate-all-around nanowire FET
IBM4 citations73
US9960347B2May 1, 2018
Structure and method to reduce shorting and process degradation in STT-MRAM devices
IBM3 citations73
US9853210B2Dec 26, 2017
Reduced process degradation of spin torque magnetoresistive random access memory
IBM2 citations73
US9673386B2Jun 6, 2017
Structure and method to reduce shorting in STT-MRAM device
IBM2 citations73
US9496184B2Nov 15, 2016
III-V, SiGe, or Ge base lateral bipolar transistor and CMOS hybrid technology
IBM5 citations73
US10388857B2Aug 20, 2019
Spin torque MRAM fabrication using negative tone lithography and ion beam etching
IBM1 citations72
US10084127B2Sep 25, 2018
Enhanced coercivity in MTJ devices by contact depth control
IBM1 citations63
US9947863B2Apr 17, 2018
Structure and method to reduce shorting in STT-MRAM device
IBM1 citations63
US9543388B2Jan 10, 2017
Complementary metal-oxide silicon having silicon and silicon germanium channels
IBM1 citations63
US11011698B2May 18, 2021
Enhanced coercivity in MTJ devices by contact depth control
IBM0 citations62
US10497862B2Dec 3, 2019
Enhanced coercivity in MTJ devices by contact depth control
IBM0 citations52
US9954062B2Apr 24, 2018
Stacked planar double-gate lamellar field-effect transistor
IBM0 citations52
US9954063B2Apr 24, 2018
Stacked planar double-gate lamellar field-effect transistor
IBM0 citations52
US9859375B2Jan 2, 2018
Stacked planar double-gate lamellar field-effect transistor
IBM0 citations52
US9748310B2Aug 29, 2017
Structure and method to reduce shorting in STT-MRAM device
IBM0 citations52
US9691972B1Jun 27, 2017
Low temperature encapsulation for magnetic tunnel junction
IBM1 citations52
US9466673B2Oct 11, 2016
Complementary metal-oxide silicon having silicon and silicon germanium channels
IBM0 citations52
US8853662B2Oct 7, 2014
Self-aligned process to fabricate a memory cell array with a surrounding-gate access transistor
IBM0 citations52
US10170698B2Jan 1, 2019
Spin torque MRAM fabrication using negative tone lithography and ion beam etching
IBM0 citations51
US8927431B2Jan 6, 2015
High-rate chemical vapor etch of silicon substrates
IBM0 citations51
BRIGHTSKY MATTHEW J
5 patentsUS8614117B2Dec 24, 2013
Self-aligned process to fabricate a memory cell array with a surrounding-gate access transistor
BRIGHTSKY MATTHEW J4 citations61
US9012970B2Apr 21, 2015
Self-aligned process to fabricate a memory cell array with a surrounding-gate access transistor
BRIGHTSKY MATTHEW J0 citations51
US8835898B2Sep 16, 2014
Self-aligned process to fabricate a memory cell array with a surrounding-gate access transistor
BRIGHTSKY MATTHEW J0 citations51
US8673717B2Mar 18, 2014
Self-aligned process to fabricate a memory cell array with a surrounding-gate access transistor
BRIGHTSKY MATTHEW J0 citations51
US8592250B2Nov 26, 2013
Self-aligned process to fabricate a memory cell array with a surrounding-gate access transistor
BRIGHTSKY MATTHEW J0 citations51