Inventor

KUNG JI-FU

TW21 patents

⚠️ This page may combine multiple inventors who share the name “KUNG JI-FU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KUNG JI-FU

UNITED MICROELECTRONICS CORP

Method for controlling lattice defects at junction and method for forming LDD or S/D regions of CMOS device

Integrated circuit structure with semiconductor devices and method of fabricating the same

Integrated circuit structure with semiconductor devices and method of fabricating the same

Manufacturing data analyzing method and manufacturing data analyzing device

Remote control device for manufacturing equipment and method for detecting manual control

Operation method and operation device of failure detection and classification model

Automatic adjustment method and automatic adjustment device of beam of semiconductor apparatus, and training method of parameter adjustment model

Apparatus and method for controlling operation of machine

Semiconductor device with epitaxial structures and method for fabricating the same

Hierarchical wafer lifetime prediction method

Hierarchical wafer yield prediction method and hierarchical lifetime prediction method

Layout correcting method and layout correcting system

Integrated circuit structure with semiconductor devices and method of fabricating the same

Integrated circuit structure with semiconductor devices and method of fabricating the same

Stacked semiconductor structure and manufacturing method for the same

HOU HSIN-MING

Integrated circuit design and fabrication method by way of detecting and scoring hotspots

Semiconductor device and method for fabricating the same

Multi-gate transistor device

Experiments method for predicting wafer fabrication outcome

Transistor array for testing

HUANG CHIN-CHUN

Monitoring testkey used in semiconductor fabrication