Inventor
SU WEI-JHIH
TW33 patents
Patents
33 patentsUS12467949B2Nov 11, 2025
Cantilever probe card device and light absorption probe
CHUNGHWA PREC TEST TECH CO LTD2 citations72
US11913973B2Feb 27, 2024
Cantilever probe card device and focusing probe thereof
CHUNGHWA PREC TEST TECH CO LTD4 citations72
US11879912B2Jan 23, 2024
Cantilever probe card and carrier thereof
CHUNGHWA PREC TEST TECH CO LTD4 citations72
US11226354B1Jan 18, 2022
Probe card device and fence-like probe thereof
CHUNGHWA PREC TEST TECH CO LTD6 citations72
US10845385B2Nov 24, 2020
Probe card device
CHUNGHWA PREC TEST TECH CO LTD5 citations72
US10613117B2Apr 7, 2020
Probe card device and rectangular probe thereof
CHUNGHWA PREC TEST TECH CO LTD4 citations72
US12181496B2Dec 31, 2024
Cantilever probe card and probe module thereof
CHUNGHWA PREC TEST TECH CO LTD2 citations71
US12092661B2Sep 17, 2024
Cantilever probe card device and elastic probe thereof
CHUNGHWA PREC TEST TECH CO LTD2 citations71
US11561244B2Jan 24, 2023
Board-like connector, dual-ring bridge of board-like connector, and wafer testing assembly
CHUNGHWA PREC TEST TECH CO LTD2 citations71
US11460486B1Oct 4, 2022
Probe card device and spring-like probe
CHUNGHWA PREC TEST TECH CO LTD3 citations70
US10605830B2Mar 31, 2020
Probe card device and rectangular probe thereof having ring-shaped branch segment
CHUNGHWA PREC TEST TECH CO LTD1 citations61
US11009526B2May 18, 2021
Probe card device and three-dimensional signal transfer structure thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations51
US12590990B2Mar 31, 2026
Cantilever probe card device and micro electro mechanical system (MEMS) probe
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US12590994B2Mar 31, 2026
Cantilever probe card device and solder receiving probe
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US12203961B2Jan 21, 2025
Vertical probe card device and fence-like probe thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US12146897B2Nov 19, 2024
Vertical probe card having different probes
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US12111336B2Oct 8, 2024
Modular vertical probe card
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US11988686B2May 21, 2024
Vertical probe card and fence-like probe thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US11747395B2Sep 5, 2023
Board-like connector, single-arm bridge of board-like connector, and wafer testing assembly
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US11699871B2Jul 11, 2023
Board-like connector, dual-arm bridge of board-like connector, and wafer testing assembly
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US11073537B2Jul 27, 2021
Probe card device
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US11041883B2Jun 22, 2021
Probe card device and rectangular probe thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US10901001B2Jan 26, 2021
Probe card device and probe head
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US11592466B2Feb 28, 2023
Probe card device and self-aligned probe
CHUNGHWA PREC TEST TECH CO LTD0 citations49
US11536744B2Dec 27, 2022
Probe card device and dual-arm probe
CHUNGHWA PREC TEST TECH CO LTD0 citations49
US11506685B1Nov 22, 2022
Probe card device and disposable adjustment film thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations49
US11209461B2Dec 28, 2021
Probe card device and neck-like probe thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations49
US11204371B2Dec 21, 2021
Probe card device
CHUNGHWA PREC TEST TECH CO LTD0 citations49
US11175312B2Nov 16, 2021
Staggered probe card
CHUNGHWA PREC TEST TECH CO LTD0 citations41
US10670630B2Jun 2, 2020
Probe card device and rectangular probe
CHUNGHWA PREC TEST TECH CO LTD0 citations40
US10615768B2Apr 7, 2020
Probe assembly and capacitive space transformer thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations40
US10509057B2Dec 17, 2019
Probe assembly and probe structure thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations40
US10401388B2Sep 3, 2019
Probe card device and rectangular probe thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations40