Inventor
YOKOSUKA TOSHIYUKI
JP31 patents
⚠️ This page may combine multiple inventors who share the name “YOKOSUKA TOSHIYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
24 patentsUS7473892B2Jan 6, 2009
Mass spectrometer system
HITACHI HIGH TECH CORP72 citations98
US7932486B2Apr 26, 2011
Mass spectrometer system
HITACHI HIGH TECH CORP7 citations84
US7595484B2Sep 29, 2009
Mass spectrometric method, mass spectrometric system, diagnosis system, inspection system, and mass spectrometric program
HITACHI HIGH TECH CORP16 citations84
US11011348B2May 18, 2021
Scanning electron microscope and sample observation method using scanning electron microscope
HITACHI HIGH TECH CORP8 citations83
US10720306B2Jul 21, 2020
Charged particle beam device
HITACHI HIGH TECH CORP4 citations83
US10249474B2Apr 2, 2019
Charged particle beam device
HITACHI HIGH TECH CORP4 citations83
US9697987B2Jul 4, 2017
Charged particle beam device
HITACHI HIGH TECH CORP9 citations83
US11133147B2Sep 28, 2021
Charged particle ray device and cross-sectional shape estimation program
HITACHI HIGH TECH CORP2 citations72
US9786468B2Oct 10, 2017
Charged particle beam device
HITACHI HIGH TECH CORP4 citations72
US9472376B2Oct 18, 2016
Scanning electron microscope
HITACHI HIGH TECH CORP4 citations72
US10541103B2Jan 21, 2020
Charged particle beam device
HITACHI HIGH TECH CORP3 citations68
US7544930B2Jun 9, 2009
Tandem type mass analysis system and method
HITACHI HIGH TECH CORP2 citations63
US7126113B2Oct 24, 2006
Mass spectrometry system
HITACHI HIGH TECH CORP2 citations63
US11798780B2Oct 24, 2023
Charged particle beam device
HITACHI HIGH TECH CORP0 citations62
US11239052B2Feb 1, 2022
Charged particle beam device
HITACHI HIGH TECH CORP0 citations62
US11211226B2Dec 28, 2021
Pattern cross-sectional shape estimation system and program
HITACHI HIGH TECH CORP1 citations62
US10566172B2Feb 18, 2020
Charged particle beam apparatus and method for adjusting imaging conditions for the same
HITACHI HIGH TECH CORP1 citations61
US11443914B2Sep 13, 2022
Charged-particle beam device and cross-sectional shape estimation program
HITACHI HIGH TECH CORP0 citations52
US10290464B2May 14, 2019
Charged particle beam device and pattern measurement device
HITACHI HIGH TECH CORP0 citations52
US7435949B2Oct 14, 2008
Mass spectrometric analysis method and system using the method
HITACHI HIGH TECH CORP1 citations52
US11164720B2Nov 2, 2021
Scanning electron microscope and calculation method for three-dimensional structure depth
HITACHI HIGH TECH CORP0 citations51
US10770266B2Sep 8, 2020
Charged particle beam device and capturing condition adjusting method in charged particle beam device
HITACHI HIGH TECH CORP0 citations51
US12518942B2Jan 6, 2026
Charged particle beam device
HITACHI HIGH TECH CORP0 citations48
US10446359B2Oct 15, 2019
Charged particle beam device
HITACHI HIGH TECH CORP0 citations41