Inventor
Wang yu-chen
TW17 patents
⚠️ This page may combine multiple inventors who share the name “Wang yu-chen”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MACRONIX INT CO LTD
10 patentsUS9147501B2Sep 29, 2015
Retention logic for non-volatile memory
MACRONIX INT CO LTD5 citations84
US10809925B2Oct 20, 2020
Configurable security memory region
MACRONIX INT CO LTD1 citations62
US9514834B2Dec 6, 2016
Retention logic for non-volatile memory
MACRONIX INT CO LTD1 citations52
US9093172B2Jul 28, 2015
Method and apparatus for leakage suppression in flash memory in response to external commands
MACRONIX INT CO LTD0 citations52
US7969803B2Jun 28, 2011
Method and apparatus for protection of non-volatile memory in presence of out-of-specification operating voltage
MACRONIX INT CO LTD1 citations52
US9678829B2Jun 13, 2017
Memory device and erasing method thereof
MACRONIX INT CO LTD0 citations51
US9400712B2Jul 26, 2016
Memory device and erasing method thereof
MACRONIX INT CO LTD0 citations51
US9208842B2Dec 8, 2015
Method and system for operating memory
MACRONIX INT CO LTD0 citations49
US10409735B2Sep 10, 2019
Electronic device and data exchange method including protocol indicative of modes of operation
MACRONIX INT CO LTD0 citations41
US9514088B2Dec 6, 2016
Method and device for processing serial binary input by comparing binary digits at even and odd locations of the input
MACRONIX INT CO LTD0 citations41
TAIWAN SEMICONDUCTOR MFG CO LTD
3 patentsUS11069419B2Jul 20, 2021
Test line letter for embedded non-volatile memory technology
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US10163522B2Dec 25, 2018
Test line letter for embedded non-volatile memory technology
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48
US9983257B2May 29, 2018
Test line patterns in split-gate flash technology
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations48