Inventor
PAN JIN
CN21 patents
⚠️ This page may combine multiple inventors who share the name “PAN JIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
6 patentsUS7345495B2Mar 18, 2008
Temperature and voltage controlled integrated circuit processes
INTEL CORP29 citations88
US8963135B2Feb 24, 2015
Integrated circuits and systems and methods for producing the same
INTEL CORP9 citations83
US10677845B2Jun 9, 2020
Converged test platforms and processes for class and system testing of integrated circuits
INTEL CORP2 citations68
US10469181B2Nov 5, 2019
High density low cost wideband production RF test instrument architecture
INTEL CORP2 citations68
US6577147B2Jun 10, 2003
Method and apparatus for resisting probe burn using shape memory alloy probe during testing of an electronic device
INTEL CORP5 citations62
US10101367B2Oct 16, 2018
Microelectronic test device including a probe card having an interposer
INTEL CORP0 citations50
SONY CORP
3 patentsUS7248558B2Jul 24, 2007
Mastering device, disc manufacturing method, disc-shaped recording medium, disc reproduction device, and disc reproduction method
SONY CORP27 citations92
US7596075B2Sep 29, 2009
Mastering device, disc manufacturing method, disc-shaped recording medium, disc reproduction device, and disc reproduction method
SONY CORP5 citations74
US7903522B2Mar 8, 2011
Mastering device, disc manufacturing method, disc-shaped recording medium, disc reproduction device, and disc reproduction method
SONY CORP0 citations52