Inventor
SAYAMA HIROKAZU
JP48 patents
⚠️ This page may combine multiple inventors who share the name “SAYAMA HIROKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
RENESAS ELECTRONICS CORP
21 patentsUS8372747B2Feb 12, 2013
Semiconductor device including gate electrode for applying tensile stress to silicon substrate, and method of manufacturing the same
RENESAS ELECTRONICS CORP8 citations92
US7960281B2Jun 14, 2011
Semiconductor device including gate electrode for applying tensile stress to silicon substrate, and method of manufacturing the same
RENESAS ELECTRONICS CORP15 citations92
US9614081B2Apr 4, 2017
Semiconductor device including gate electrode for applying tensile stress to silicon substrate, and method of manufacturing the same
RENESAS ELECTRONICS CORP3 citations84
US9412867B2Aug 9, 2016
Semiconductor device including gate electrode for applying tensile stress to silicon substrate, and method of manufacturing the same
RENESAS ELECTRONICS CORP3 citations84
US9209191B2Dec 8, 2015
Semiconductor device including gate electrode for applying tensile stress to silicon substrate, and method of manufacturing the same
RENESAS ELECTRONICS CORP5 citations84
US8809186B2Aug 19, 2014
Semiconductor device including gate electrode for applying tensile stress to silicon substrate, and method of manufacturing the same
RENESAS ELECTRONICS CORP6 citations84
US8586475B2Nov 19, 2013
Semiconductor device including gate electrode for applying tensile stress to silicon substrate, and method of manufacturing the same
RENESAS ELECTRONICS CORP7 citations84
US8541272B2Sep 24, 2013
Method of manufacturing semiconductor device with offset sidewall structure
RENESAS ELECTRONICS CORP1 citations63
US12198987B2Jan 14, 2025
Semiconductor device including gate electrode for applying tensile stress to silicon substrate, and method of manufacturing the same
RENESAS ELECTRONICS CORP0 citations62
US11798886B2Oct 24, 2023
Semiconductor device and method of manufacturing the same
RENESAS ELECTRONICS CORP0 citations62
US11502036B2Nov 15, 2022
Semiconductor device and method of manufacturing the same
RENESAS ELECTRONICS CORP1 citations62
US12288760B2Apr 29, 2025
Semiconductor device
RENESAS ELECTRONICS CORP0 citations52
US9847417B2Dec 19, 2017
Semiconductor device including gate electrode for applying tensile stress to silicon substrate, and method of manufacturing the same
RENESAS ELECTRONICS CORP0 citations52
US9349816B2May 24, 2016
Method of manufacturing semiconductor device with offset sidewall structure
RENESAS ELECTRONICS CORP0 citations52
US9214464B2Dec 15, 2015
Method of manufacturing semiconductor device with offset sidewall structure
RENESAS ELECTRONICS CORP0 citations52
US9112013B2Aug 18, 2015
Semiconductor device and method for producing the same
RENESAS ELECTRONICS CORP0 citations52
US8987081B2Mar 24, 2015
Method of manufacturing semiconductor device with offset sidewall structure
RENESAS ELECTRONICS CORP0 citations52
US8859360B2Oct 14, 2014
Method of manufacturing semiconductor device with offset sidewall structure
RENESAS ELECTRONICS CORP0 citations52
US8642418B2Feb 4, 2014
Method of manufacturing semiconductor device with offset sidewall structure
RENESAS ELECTRONICS CORP0 citations52
US7998802B2Aug 16, 2011
Method of manufacturing semiconductor device with offset sidewall structure
RENESAS ELECTRONICS CORP0 citations52
US8742497B2Jun 3, 2014
Semiconductor device
RENESAS ELECTRONICS CORP0 citations42
RENESAS TECH CORP
14 patentsUS6906393B2Jun 14, 2005
Semiconductor device including gate electrode for applying tensile stress to silicon substrate, and method of manufacturing the same
RENESAS TECH CORP56 citations97
US7470618B2Dec 30, 2008
Semiconductor device including gate electrode for applying tensile stress to silicon substrate, and method of manufacturing the same
RENESAS TECH CORP29 citations96
US7183204B2Feb 27, 2007
Semiconductor device including gate electrode for applying tensile stress to silicon substrate, and method of manufacturing the same
RENESAS TECH CORP24 citations96
US6740939B2May 25, 2004
Semiconductor device and manufacturing method thereof
RENESAS TECH CORP61 citations96
US7563663B2Jul 21, 2009
Method of manufacturing semiconductor device with offset sidewall structure
RENESAS TECH CORP9 citations93
US7531402B2May 12, 2009
Method of manufacturing semiconductor device with offset sidewall structure
RENESAS TECH CORP18 citations93
US7220637B2May 22, 2007
Method of manufacturing semiconductor device with offset sidewall structure
RENESAS TECH CORP20 citations93
US6872642B2Mar 29, 2005
Manufacturing method of semiconductor device
RENESAS TECH CORP23 citations92
US7109553B2Sep 19, 2006
Semiconductor device and method of manufacturing same
RENESAS TECH CORP14 citations84
US6806537B2Oct 19, 2004
Semiconductor device having offset insulation film formed on insulation film, and method of manufacturing the same
RENESAS TECH CORP13 citations84
US7015107B2Mar 21, 2006
Method of manufacturing semiconductor device
RENESAS TECH CORP10 citations74
US6835610B2Dec 28, 2004
Method of manufacturing semiconductor device having gate electrode with expanded upper portion
RENESAS TECH CORP8 citations74
US6670277B2Dec 30, 2003
Method of manufacturing semiconductor device
RENESAS TECH CORP3 citations63
US6667206B2Dec 23, 2003
Method of manufacturing semiconductor device
RENESAS TECH CORP3 citations63
MITSUBISHI ELECTRIC CORP
11 patentsUS5889335AMar 30, 1999
Semiconductor device and method of manufacturing the same
MITSUBISHI ELECTRIC CORP105 citations98
US6218262B1Apr 17, 2001
Semiconductor device and method of manufacturing the same
MITSUBISHI ELECTRIC CORP62 citations96
US6232187B1May 15, 2001
Semiconductor device and manufacturing method thereof
MITSUBISHI ELECTRIC CORP27 citations93
US5744845AApr 28, 1998
Complementary MOS field effect transistor with tunnel effect means
MITSUBISHI ELECTRIC CORP53 citations93
US6344388B1Feb 5, 2002
Method of manufacturing semiconductor device
MITSUBISHI ELECTRIC CORP24 citations92
US6335252B1Jan 1, 2002
Semiconductor device manufacturing method
MITSUBISHI ELECTRIC CORP31 citations92
US6281558B1Aug 28, 2001
Semiconductor device and manufacturing method thereof
MITSUBISHI ELECTRIC CORP48 citations92
US6017800AJan 25, 2000
Semiconductor device and method of fabricating thereof
MITSUBISHI ELECTRIC CORP16 citations84
US6600180B1Jul 29, 2003
Semiconductor device, method of manufacturing the same and exposure mask for implantation
MITSUBISHI ELECTRIC CORP18 citations80
US6600195B1Jul 29, 2003
Semiconductor device
MITSUBISHI ELECTRIC CORP11 citations74
US6506651B2Jan 14, 2003
Semiconductor device and manufacturing method thereof
MITSUBISHI ELECTRIC CORP2 citations63