Inventor

HUANG WEN-SHEH

TW32 patents

⚠️ This page may combine multiple inventors who share the name “HUANG WEN-SHEH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HUANG WEN-SHEH

TAIWAN SEMICONDUCTOR MFG CO LTD

Method for forming semiconductor device with resistive element

Structure and formation method of semiconductor device with resistive element

Semiconductor device structure with resistive element

Structure and formation method of semiconductor device with resistive elements

Semiconductor device structure with resistive element

Thermal dissipation in semiconductor devices

Semiconductor device structure with resistive element

Thermal dissipation in semiconductor devices

One-time-programmable device structure

Semiconductor devices and method for forming the same

Thermal dissipation in semiconductor devices

Semiconductor devices and method for forming the same

Semiconductor device structure with resistive element

Method for manufacturing semiconductor structure with resistive elements

Semiconductor device structure with resistive element

Semiconductor device structure with resistive elements

Nitrogen plasma treatment for improving interface between etch stop layer and copper interconnect

Interconnect level with high resistance layer and method of forming the same

Interconnect level with high resistance layer and method of forming the same

Structure and method of forming a semiconductor device with resistive elements

Back-end-of-line devices

Back-end-of-line devices

Structure and method of forming a semiconductor device with resistive elements

Semiconductor device and layout method

Nitrogen plasma treatment for improving interface between etch stop layer and copper interconnect

Thermal sensor device by back end of line metal resistor

TAIWAN SEMICONDUCTOR MFG

Integrated method for forming high-k metal gate FinFET devices

Method and apparatus of deembedding

TSAI CHUN HSIUNG

FinFET LDD and source drain implant technique

Yu de-wei

Methods of forming integrated circuits

CHO HSIU-YING

Transmission line characterization using EM calibration

LIN CHIA-PIN

Integrated method for forming metal gate FinFET devices