Inventor
TCHO JONG-BOK
KR3 patents
Patents
3 patentsUS6201746B1Mar 13, 2001
Test method for high speed memory devices in which limit conditions for the clock are defined
SAMSUNG ELECTRONICS CO LTD9 citations71
US6842031B2Jan 11, 2005
Method of electrically testing semiconductor devices
SAMSUNG ELECTRONICS CO LTD7 citations66
US7168017B2Jan 23, 2007
Memory devices with selectively enabled output circuits for test mode and method of testing the same
SAMSUNG ELECTRONICS CO LTD6 citations60