Inventor

SWEENOR DAVID E

US3 patents

Patents

3 patents

US7194706B2Mar 20, 2007

Designing scan chains with specific parameter sensitivities to identify process defects

IBM24 citations91

US7558999B2Jul 7, 2009

Learning based logic diagnosis

IBM7 citations71

US7089514B2Aug 8, 2006

Defect diagnosis for semiconductor integrated circuits

IBM1 citations48