Inventor
SUGIURA KAZUSHI
JP17 patents
⚠️ This page may combine multiple inventors who share the name “SUGIURA KAZUSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TDK CORP
7 patentsUS5591988AJan 7, 1997
Solid state imaging device with low trap density
TDK CORP59 citations96
US6100860AAug 8, 2000
Image display device
TDK CORP47 citations92
US5821560AOct 13, 1998
Thin film transistor for controlling a device such as a liquid crystal cell or electroluminescent element
TDK CORP24 citations92
US5576222ANov 19, 1996
Method of making a semiconductor image sensor device
TDK CORP50 citations92
US5574293ANov 12, 1996
Solid state imaging device using disilane
TDK CORP27 citations92
US5298455AMar 29, 1994
Method for producing a non-single crystal semiconductor device
TDK CORP33 citations92
US5442198AAug 15, 1995
Non-single crystal semiconductor device with sub-micron grain size
TDK CORP19 citations81
MITSUBISHI ELECTRIC CORP
4 patentsUS6345004B1Feb 5, 2002
Repair analysis circuit for redundancy, redundant repairing method, and semiconductor device
MITSUBISHI ELECTRIC CORP86 citations96
US6311300B1Oct 30, 2001
Semiconductor testing apparatus for testing semiconductor device including built in self test circuit
MITSUBISHI ELECTRIC CORP22 citations90
US6646461B2Nov 11, 2003
Method and apparatus for testing semiconductor devices using improved testing sequence
MITSUBISHI ELECTRIC CORP17 citations81
US6586823B2Jul 1, 2003
Semiconductor device that can have a defective bit found during or after packaging process repaired
MITSUBISHI ELECTRIC CORP18 citations81
RENESAS TECH CORP
3 patentsRYODEN SEMICONDUCTOR SYST ENG
2 patentsUS6993696B1Jan 31, 2006
Semiconductor memory device with built-in self test circuit operating at high rate
RYODEN SEMICONDUCTOR SYST ENG30 citations92
US6584592B2Jun 24, 2003
Semiconductor testing apparatus for testing semiconductor device including built in self test circuit
RYODEN SEMICONDUCTOR SYST ENG9 citations71