Inventor
KONNO YOSHIHIRO
JP29 patents
⚠️ This page may combine multiple inventors who share the name “KONNO YOSHIHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NAMIKI PRECISION JEWEL CO LTD
6 patentsUS5293438AMar 8, 1994
Microlensed optical terminals and optical system equipped therewith, and methods for their manufacture, especially an optical coupling method and optical coupler for use therewith
NAMIKI PRECISION JEWEL CO LTD98 citations91
US5774264AJun 30, 1998
Polarization independent optical isolator
NAMIKI PRECISION JEWEL CO LTD42 citations90
US7826137B2Nov 2, 2010
Reflective optical circulator
NAMIKI PRECISION JEWEL CO LTD4 citations63
US7446847B2Nov 4, 2008
Optical isolator and optical device
NAMIKI PRECISION JEWEL CO LTD5 citations63
US5204868AApr 20, 1993
Optical isolator and method for assembling same
NAMIKI PRECISION JEWEL CO LTD5 citations62
US7176671B2Feb 13, 2007
Current measuring device
NAMIKI PRECISION JEWEL CO LTD5 citations60
NISSAN MOTOR
4 patentsUS7771137B2Aug 10, 2010
Connecting structure for hollow member or half hollow member
NISSAN MOTOR34 citations91
US9789743B2Oct 17, 2017
Suspension structure for vehicle
NISSAN MOTOR8 citations79
US6598778B2Jul 29, 2003
Aluminum-based metal link for vehicles and a method for producing same
NISSAN MOTOR11 citations72
US7748727B2Jul 6, 2010
Suspension structure
NISSAN MOTOR5 citations59
KONNO YOSHIHIRO
4 patentsUS9114088B2Aug 25, 2015
Cosmetic preparation for hair and method for application thereof
KONNO YOSHIHIRO16 citations83
US9465053B2Oct 11, 2016
Optical fibre birefringence compensation mirror and current sensor
KONNO YOSHIHIRO1 citations51
US8957667B2Feb 17, 2015
Electric current measuring apparatus
KONNO YOSHIHIRO1 citations51
US9285435B2Mar 15, 2016
Two-core optical fiber magnetic field sensor
KONNO YOSHIHIRO0 citations40
NEC CORP
3 patentsUS5801972ASep 1, 1998
Individual test program producing system
NEC CORP8 citations74
US7484150B2Jan 27, 2009
Semiconductor integrated circuit design apparatus and semiconductor integrated circuit design method
NEC CORP0 citations52
US7451372B2Nov 11, 2008
Circuit test pattern edition apparatus, circuit test pattern editing method, and signal-bearing medium embodying a program of circuit test pattern edition
NEC CORP0 citations52