Inventor
KOBAYASHI KATSUHIKO
JP59 patents
⚠️ This page may combine multiple inventors who share the name “KOBAYASHI KATSUHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOPCON CORP
12 patentsUS6042233AMar 28, 2000
Optical characteristic measuring apparatus
TOPCON CORP76 citations96
US6565210B2May 20, 2003
Ocular optical characteristic measuring apparatus
TOPCON CORP21 citations93
US6273566B1Aug 14, 2001
Ophthalmologic characteristic measuring apparatus
TOPCON CORP34 citations93
US5633694AMay 27, 1997
Ophthalmometric apparatus for generating an image of a selection and a surface of an eyeground of a subject
TOPCON CORP26 citations92
US6623117B2Sep 23, 2003
Eye's optical characteristic measuring system
TOPCON CORP23 citations91
US5546142AAug 13, 1996
Method and apparatus of optometry
TOPCON CORP18 citations82
US6699238B1Mar 2, 2004
Laser operating system
TOPCON CORP8 citations73
US7261416B2Aug 28, 2007
Eye's optical characteristics measuring system
TOPCON CORP7 citations72
US5774615AJun 30, 1998
Optical fiber with a metal layer to maintain the desired shape of the optical fiber
TOPCON CORP16 citations68
US6824269B2Nov 30, 2004
Eye's optical characteristic measuring system
TOPCON CORP6 citations61
US6676258B2Jan 13, 2004
Eye characteristic measurement apparatus with speckle noise reduction
TOPCON CORP2 citations60
US7011411B2Mar 14, 2006
Eye's optical characteristic measuring system
TOPCON CORP2 citations57
TYCO ELECTRONICS JAPAN G K
8 patentsUS11382231B2Jul 5, 2022
Socket connector and cable assembly for a communication system
TYCO ELECTRONICS JAPAN G K2 citations73
US10505302B2Dec 10, 2019
Connector
TYCO ELECTRONICS JAPAN G K5 citations71
US11646518B2May 9, 2023
Connector with a contact retained in a housing
TYCO ELECTRONICS JAPAN G K0 citations62
US11539153B2Dec 27, 2022
Connector
TYCO ELECTRONICS JAPAN G K1 citations62
US10784605B2Sep 22, 2020
Connector with a contact retained in a housing
TYCO ELECTRONICS JAPAN G K1 citations62
US11456556B2Sep 27, 2022
Bracket with an overlapping portion and connector assembly having the bracket
TYCO ELECTRONICS JAPAN G K1 citations60
US11038301B2Jun 15, 2021
Connector assembly with a plurality of circuit boards
TYCO ELECTRONICS JAPAN G K0 citations60
US9083117B2Jul 14, 2015
Card connector
TYCO ELECTRONICS JAPAN G K0 citations52
TOKYO OPTICAL
6 patentsUS4665923AMay 19, 1987
Non-contact type tonometer
TOKYO OPTICAL29 citations93
US4817620AApr 4, 1989
Noncontact type tonometer
TOKYO OPTICAL43 citations91
US4848899AJul 18, 1989
Fixation sight apparatus for ophthalmologic instrument
TOKYO OPTICAL9 citations74
US4834527AMay 30, 1989
Working distance alignment optical system for ophthalmological instrument
TOKYO OPTICAL16 citations74
US4740071AApr 26, 1988
Subjective ophthalmic instrument
TOKYO OPTICAL10 citations74
US4676612AJun 30, 1987
Eye examining apparatus
TOKYO OPTICAL5 citations63
CHISSO CORP
5 patentsUS6007740ADec 28, 1999
Polyhaloalkyl ether derivatives as well as liquid crystal compositions and liquid crystal display elements containing them
CHISSO CORP72 citations96
US6187223B1Feb 13, 2001
Polyhaloalkyl ether derivatives as well as liquid crystal compositions and liquid crystal display elements containing them
CHISSO CORP38 citations92
US5961881AOct 5, 1999
Liquid crystal composition and liquid crystal display element
CHISSO CORP32 citations92
US6231785B1May 15, 2001
Benzene derivative and its production method
CHISSO CORP16 citations84
US4943512AJul 24, 1990
Photocurable and dyeable resin composition with bisazide and dyeable acrylic copolymer
CHISSO CORP9 citations74
FUJITSU LTD
4 patentsUS6222195B1Apr 24, 2001
Charged-particle-beam exposure device and charged-particle-beam exposure method
FUJITSU LTD49 citations96
US6137111AOct 24, 2000
Charged particle-beam exposure device and charged-particle-beam exposure method
FUJITSU LTD26 citations92
US5830612ANov 3, 1998
Method of detecting a deficiency in a charged-particle-beam exposure mask
FUJITSU LTD28 citations92
US5391886AFeb 21, 1995
Charged particle beam exposure system and method of exposing a pattern on an object by such a charged particle beam exposure system
FUJITSU LTD36 citations92
UNIV MIAMI SCHOOL OF MEDICINE
3 patentsUS5281211AJan 25, 1994
Noncontact laser microsurgical apparatus
UNIV MIAMI SCHOOL OF MEDICINE204 citations98
US5152759AOct 6, 1992
Noncontact laser microsurgical apparatus
UNIV MIAMI SCHOOL OF MEDICINE149 citations98
US6210399B1Apr 3, 2001
Noncontact laser microsurgical method
UNIV MIAMI SCHOOL OF MEDICINE57 citations95
WHITAKER CORP
3 patentsTYCO ELECTRONICS AMP KK
3 patentsNEC CORP
2 patents(unassigned)
1 patentKOBAYASHI KATSUHIKO
1 patentTE CONNECTIVITY CORP
1 patentTAKATA CORP
1 patentShowing the top 50 of 59 patents by PatentIndex Score.