Inventor
HSU CHEN-CHUNG
TW98 patents
⚠️ This page may combine multiple inventors who share the name “HSU CHEN-CHUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
48 patentsUS5946558AAug 31, 1999
Method of making ROM components
UNITED MICROELECTRONICS CORP201 citations99
US5858841AJan 12, 1999
ROM device having memory units arranged in three dimensions, and a method of making the same
UNITED MICROELECTRONICS CORP149 citations99
US5627106AMay 6, 1997
Trench method for three dimensional chip connecting during IC fabrication
UNITED MICROELECTRONICS CORP523 citations99
US5481133AJan 2, 1996
Three-dimensional multichip package
UNITED MICROELECTRONICS CORP564 citations99
US5380681AJan 10, 1995
Three-dimensional multichip package and methods of fabricating
UNITED MICROELECTRONICS CORP412 citations99
US6174804B1Jan 16, 2001
Dual damascene manufacturing process
UNITED MICROELECTRONICS CORP103 citations98
US6018186AJan 25, 2000
Three-dimensional, deep-trench, high-density read-only memory (ROM) and its manufacturing method
UNITED MICROELECTRONICS CORP99 citations98
US5576227ANov 19, 1996
Process for fabricating a recessed gate MOS device
UNITED MICROELECTRONICS CORP119 citations98
US5783457AJul 21, 1998
Method of making a flash memory cell having an asymmetric source and drain pocket structure
UNITED MICROELECTRONICS CORP80 citations96
US5693552ADec 2, 1997
Method for fabricating read-only memory device with a three-dimensional memory cell structure
UNITED MICROELECTRONICS CORP69 citations96
US5491099AFeb 13, 1996
Method of making silicided LDD with recess in semiconductor substrate
UNITED MICROELECTRONICS CORP94 citations96
US5472897ADec 5, 1995
Method for fabricating MOS device with reduced anti-punchthrough region
UNITED MICROELECTRONICS CORP60 citations96
US6274468B1Aug 14, 2001
Method of manufacturing borderless contact
UNITED MICROELECTRONICS CORP26 citations93
US6236073B1May 22, 2001
Electrostatic discharge device
UNITED MICROELECTRONICS CORP20 citations93
US6171954B1Jan 9, 2001
Method of manufacturing self-aligned contact
UNITED MICROELECTRONICS CORP32 citations93
US6153913ANov 28, 2000
Electrostatic discharge protection circuit
UNITED MICROELECTRONICS CORP36 citations93
US6097235AAug 1, 2000
Field device electrostatic discharge protective circuit
UNITED MICROELECTRONICS CORP20 citations93
US6087251AJul 11, 2000
Method of fabricating a dual damascene structure
UNITED MICROELECTRONICS CORP24 citations93
US6077770AJun 20, 2000
Damascene manufacturing process capable of forming borderless via
UNITED MICROELECTRONICS CORP26 citations93
US6018183AJan 25, 2000
Structure of manufacturing an electrostatic discharge protective circuit for SRAM
UNITED MICROELECTRONICS CORP42 citations93
US5946573AAug 31, 1999
Self-aligned silicide (salicide) process for electrostatic discharge (ESD) protection
UNITED MICROELECTRONICS CORP28 citations93
US5903024AMay 11, 1999
Stacked and trench type DRAM capacitor
UNITED MICROELECTRONICS CORP20 citations93
US5891772AApr 6, 1999
Structure and manufacturing method for DRAM capacitors
UNITED MICROELECTRONICS CORP23 citations93
US5777486AJul 7, 1998
Electromigration test pattern simulating semiconductor components
UNITED MICROELECTRONICS CORP36 citations93
US5712203AJan 27, 1998
Process for fabricating read-only memory cells using removable barrier strips
UNITED MICROELECTRONICS CORP23 citations93
US5633530AMay 27, 1997
Multichip module having a multi-level configuration
UNITED MICROELECTRONICS CORP52 citations93
US5633187AMay 27, 1997
Process for fabricating read-only memory cells
UNITED MICROELECTRONICS CORP21 citations93
US5627393AMay 6, 1997
Vertical channel device having buried source
UNITED MICROELECTRONICS CORP33 citations93
US5616946AApr 1, 1997
VLSI ROM programmed by selective diode formation
UNITED MICROELECTRONICS CORP18 citations93
US5612242AMar 18, 1997
Trench isolation method for CMOS transistor
UNITED MICROELECTRONICS CORP20 citations93
US5585299ADec 17, 1996
Process for fabricating a semiconductor electrostatic discharge (ESD) protective device
UNITED MICROELECTRONICS CORP37 citations93
US5554544ASep 10, 1996
Field edge manufacture of a T-gate LDD pocket device
UNITED MICROELECTRONICS CORP30 citations93
US5550075AAug 27, 1996
Ion implanted programmable cell for read only memory applications
UNITED MICROELECTRONICS CORP20 citations93
US5547903AAug 20, 1996
Method of elimination of junction punchthrough leakage via buried sidewall isolation
UNITED MICROELECTRONICS CORP25 citations93
US5538909AJul 23, 1996
Method of making a shallow trench large-angle-tilt implanted drain device
UNITED MICROELECTRONICS CORP29 citations93
US5516717AMay 14, 1996
Method for manufacturing electrostatic discharge devices
UNITED MICROELECTRONICS CORP44 citations93
US5498556AMar 12, 1996
Metal-oxide-semiconductor field-effect transistor and its method of fabrication
UNITED MICROELECTRONICS CORP33 citations93
US5480823AJan 2, 1996
Method of making high density ROM, without using a code implant
UNITED MICROELECTRONICS CORP21 citations93
US5472894ADec 5, 1995
Method of fabricating lightly doped drain transistor device
UNITED MICROELECTRONICS CORP25 citations93
US5468541ANov 21, 1995
Thin film delamination test chip
UNITED MICROELECTRONICS CORP40 citations93
US5455190AOct 3, 1995
Method of making a vertical channel device using buried source techniques
UNITED MICROELECTRONICS CORP34 citations93
US5453635ASep 26, 1995
Lightly doped drain transistor device having the polysilicon sidewall spacers
UNITED MICROELECTRONICS CORP33 citations93
US5448094ASep 5, 1995
Concave channel MOS transistor and method of fabricating the same
UNITED MICROELECTRONICS CORP42 citations93
US6150261ANov 21, 2000
Method of fabricating semiconductor device for preventing antenna effect
UNITED MICROELECTRONICS CORP39 citations92
US6114226ASep 5, 2000
Method of manufacturing electrostatic discharge protective circuit
UNITED MICROELECTRONICS CORP32 citations92
US5414351AMay 9, 1995
Method and apparatus for testing the reliability of semiconductor terminals
UNITED MICROELECTRONICS CORP32 citations87
US6180516B1Jan 30, 2001
Method of fabricating a dual damascene structure
UNITED MICROELECTRONICS CORP19 citations84
US6040222AMar 21, 2000
Method for fabricating an electrostatistic discharge protection device to protect an integrated circuit
UNITED MICROELECTRONICS CORP18 citations84
UNITED MICROELECTRONICWS CORP
1 patentUNITED MICROELETRONICS CORP
1 patentShowing the top 50 of 98 patents by PatentIndex Score.