P

Inventor

HSU CHEN-CHUNG

TW98 patents
⚠️ This page may combine multiple inventors who share the name “HSU CHEN-CHUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

48 patents
US5946558AAug 31, 1999

Method of making ROM components

UNITED MICROELECTRONICS CORP201 citations99
US5858841AJan 12, 1999

ROM device having memory units arranged in three dimensions, and a method of making the same

UNITED MICROELECTRONICS CORP149 citations99
US5627106AMay 6, 1997

Trench method for three dimensional chip connecting during IC fabrication

UNITED MICROELECTRONICS CORP523 citations99
US5481133AJan 2, 1996

Three-dimensional multichip package

UNITED MICROELECTRONICS CORP564 citations99
US5380681AJan 10, 1995

Three-dimensional multichip package and methods of fabricating

UNITED MICROELECTRONICS CORP412 citations99
US6174804B1Jan 16, 2001

Dual damascene manufacturing process

UNITED MICROELECTRONICS CORP103 citations98
US6018186AJan 25, 2000

Three-dimensional, deep-trench, high-density read-only memory (ROM) and its manufacturing method

UNITED MICROELECTRONICS CORP99 citations98
US5576227ANov 19, 1996

Process for fabricating a recessed gate MOS device

UNITED MICROELECTRONICS CORP119 citations98
US5783457AJul 21, 1998

Method of making a flash memory cell having an asymmetric source and drain pocket structure

UNITED MICROELECTRONICS CORP80 citations96
US5693552ADec 2, 1997

Method for fabricating read-only memory device with a three-dimensional memory cell structure

UNITED MICROELECTRONICS CORP69 citations96
US5491099AFeb 13, 1996

Method of making silicided LDD with recess in semiconductor substrate

UNITED MICROELECTRONICS CORP94 citations96
US5472897ADec 5, 1995

Method for fabricating MOS device with reduced anti-punchthrough region

UNITED MICROELECTRONICS CORP60 citations96
US6274468B1Aug 14, 2001

Method of manufacturing borderless contact

UNITED MICROELECTRONICS CORP26 citations93
US6236073B1May 22, 2001

Electrostatic discharge device

UNITED MICROELECTRONICS CORP20 citations93
US6171954B1Jan 9, 2001

Method of manufacturing self-aligned contact

UNITED MICROELECTRONICS CORP32 citations93
US6153913ANov 28, 2000

Electrostatic discharge protection circuit

UNITED MICROELECTRONICS CORP36 citations93
US6097235AAug 1, 2000

Field device electrostatic discharge protective circuit

UNITED MICROELECTRONICS CORP20 citations93
US6087251AJul 11, 2000

Method of fabricating a dual damascene structure

UNITED MICROELECTRONICS CORP24 citations93
US6077770AJun 20, 2000

Damascene manufacturing process capable of forming borderless via

UNITED MICROELECTRONICS CORP26 citations93
US6018183AJan 25, 2000

Structure of manufacturing an electrostatic discharge protective circuit for SRAM

UNITED MICROELECTRONICS CORP42 citations93
US5946573AAug 31, 1999

Self-aligned silicide (salicide) process for electrostatic discharge (ESD) protection

UNITED MICROELECTRONICS CORP28 citations93
US5903024AMay 11, 1999

Stacked and trench type DRAM capacitor

UNITED MICROELECTRONICS CORP20 citations93
US5891772AApr 6, 1999

Structure and manufacturing method for DRAM capacitors

UNITED MICROELECTRONICS CORP23 citations93
US5777486AJul 7, 1998

Electromigration test pattern simulating semiconductor components

UNITED MICROELECTRONICS CORP36 citations93
US5712203AJan 27, 1998

Process for fabricating read-only memory cells using removable barrier strips

UNITED MICROELECTRONICS CORP23 citations93
US5633530AMay 27, 1997

Multichip module having a multi-level configuration

UNITED MICROELECTRONICS CORP52 citations93
US5633187AMay 27, 1997

Process for fabricating read-only memory cells

UNITED MICROELECTRONICS CORP21 citations93
US5627393AMay 6, 1997

Vertical channel device having buried source

UNITED MICROELECTRONICS CORP33 citations93
US5616946AApr 1, 1997

VLSI ROM programmed by selective diode formation

UNITED MICROELECTRONICS CORP18 citations93
US5612242AMar 18, 1997

Trench isolation method for CMOS transistor

UNITED MICROELECTRONICS CORP20 citations93
US5585299ADec 17, 1996

Process for fabricating a semiconductor electrostatic discharge (ESD) protective device

UNITED MICROELECTRONICS CORP37 citations93
US5554544ASep 10, 1996

Field edge manufacture of a T-gate LDD pocket device

UNITED MICROELECTRONICS CORP30 citations93
US5550075AAug 27, 1996

Ion implanted programmable cell for read only memory applications

UNITED MICROELECTRONICS CORP20 citations93
US5547903AAug 20, 1996

Method of elimination of junction punchthrough leakage via buried sidewall isolation

UNITED MICROELECTRONICS CORP25 citations93
US5538909AJul 23, 1996

Method of making a shallow trench large-angle-tilt implanted drain device

UNITED MICROELECTRONICS CORP29 citations93
US5516717AMay 14, 1996

Method for manufacturing electrostatic discharge devices

UNITED MICROELECTRONICS CORP44 citations93
US5498556AMar 12, 1996

Metal-oxide-semiconductor field-effect transistor and its method of fabrication

UNITED MICROELECTRONICS CORP33 citations93
US5480823AJan 2, 1996

Method of making high density ROM, without using a code implant

UNITED MICROELECTRONICS CORP21 citations93
US5472894ADec 5, 1995

Method of fabricating lightly doped drain transistor device

UNITED MICROELECTRONICS CORP25 citations93
US5468541ANov 21, 1995

Thin film delamination test chip

UNITED MICROELECTRONICS CORP40 citations93
US5455190AOct 3, 1995

Method of making a vertical channel device using buried source techniques

UNITED MICROELECTRONICS CORP34 citations93
US5453635ASep 26, 1995

Lightly doped drain transistor device having the polysilicon sidewall spacers

UNITED MICROELECTRONICS CORP33 citations93
US5448094ASep 5, 1995

Concave channel MOS transistor and method of fabricating the same

UNITED MICROELECTRONICS CORP42 citations93
US6150261ANov 21, 2000

Method of fabricating semiconductor device for preventing antenna effect

UNITED MICROELECTRONICS CORP39 citations92
US6114226ASep 5, 2000

Method of manufacturing electrostatic discharge protective circuit

UNITED MICROELECTRONICS CORP32 citations92
US5414351AMay 9, 1995

Method and apparatus for testing the reliability of semiconductor terminals

UNITED MICROELECTRONICS CORP32 citations87
US6180516B1Jan 30, 2001

Method of fabricating a dual damascene structure

UNITED MICROELECTRONICS CORP19 citations84
US6040222AMar 21, 2000

Method for fabricating an electrostatistic discharge protection device to protect an integrated circuit

UNITED MICROELECTRONICS CORP18 citations84

UNITED MICROELECTRONICWS CORP

1 patent

UNITED MICROELETRONICS CORP

1 patent

Showing the top 50 of 98 patents by PatentIndex Score.