Inventor
SPENCE CHRISTOPHER A
US37 patents
⚠️ This page may combine multiple inventors who share the name “SPENCE CHRISTOPHER A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
34 patentsUS6994939B1Feb 7, 2006
Semiconductor manufacturing resolution enhancement system and method for simultaneously patterning different feature types
ADVANCED MICRO DEVICES INC228 citations99
US6492066B1Dec 10, 2002
Characterization and synthesis of OPC structures by fourier space analysis and/or wavelet transform expansion
ADVANCED MICRO DEVICES INC232 citations99
US6187483B1Feb 13, 2001
Mask quality measurements by fourier space analysis
ADVANCED MICRO DEVICES INC163 citations99
US5766804AJun 16, 1998
Method of optical lithography using phase shift masking
ADVANCED MICRO DEVICES INC94 citations99
US5766806AJun 16, 1998
Method of optical lithography using phase shift masking
ADVANCED MICRO DEVICES INC156 citations99
US5702848ADec 30, 1997
Mask for optical lithography using phase shift masking and integrated circuit produced therefrom
ADVANCED MICRO DEVICES INC135 citations99
US5573890ANov 12, 1996
Method of optical lithography using phase shift masking
ADVANCED MICRO DEVICES INC147 citations99
US7207017B1Apr 17, 2007
Method and system for metrology recipe generation and review and analysis of design, simulation and metrology results
ADVANCED MICRO DEVICES INC85 citations97
US6356340B1Mar 12, 2002
Piezo programmable reticle for EUV lithography
ADVANCED MICRO DEVICES INC67 citations96
US7194725B1Mar 20, 2007
System and method for design rule creation and selection
ADVANCED MICRO DEVICES INC57 citations95
US5928813AJul 27, 1999
Attenuated phase shift mask
ADVANCED MICRO DEVICES INC30 citations93
US7313769B1Dec 25, 2007
Optimizing an integrated circuit layout by taking into consideration layout interactions as well as extra manufacturability margin
ADVANCED MICRO DEVICES INC30 citations92
US7269804B2Sep 11, 2007
System and method for integrated circuit device design and manufacture using optical rule checking to screen resolution enhancement techniques
ADVANCED MICRO DEVICES INC27 citations92
US7120285B1Oct 10, 2006
Method for evaluation of reticle image using aerial image simulator
ADVANCED MICRO DEVICES INC52 citations92
US6051881AApr 18, 2000
Forming local interconnects in integrated circuits
ADVANCED MICRO DEVICES INC32 citations92
US5796651AAug 18, 1998
Memory device using a reduced word line voltage during read operations and a method of accessing such a memory device
ADVANCED MICRO DEVICES INC25 citations92
US6255125B1Jul 3, 2001
Method and apparatus for compensating for critical dimension variations in the production of a semiconductor wafer
ADVANCED MICRO DEVICES INC47 citations91
US6171739B1Jan 9, 2001
Method of determining focus and coma of a lens at various locations in an imaging field
ADVANCED MICRO DEVICES INC22 citations89
US6146954ANov 14, 2000
Minimizing transistor size in integrated circuits
ADVANCED MICRO DEVICES INC18 citations84
US6046088AApr 4, 2000
Method for self-aligning polysilicon gates with field isolation and the resultant structure
ADVANCED MICRO DEVICES INC19 citations84
US7015148B1Mar 21, 2006
Reduce line end pull back by exposing and etching space after mask one trim and etch
ADVANCED MICRO DEVICES INC12 citations83
US5844836ADec 1, 1998
Memory cell having increased capacitance via a local interconnect to gate capacitor and a method for making such a cell
ADVANCED MICRO DEVICES INC17 citations83
US6627355B2Sep 30, 2003
Method of and system for improving stability of photomasks
ADVANCED MICRO DEVICES INC13 citations82
US6797438B1Sep 28, 2004
Method and enhancing clear field phase shift masks with border around edges of phase regions
ADVANCED MICRO DEVICES INC6 citations74
US6749971B2Jun 15, 2004
Method of enhancing clear field phase shift masks with chrome border around phase 180 regions
ADVANCED MICRO DEVICES INC12 citations74
US5601954AFeb 11, 1997
Attenuated phase shift mask comprising phase shifting layer with parabolically shaped sidewalls
ADVANCED MICRO DEVICES INC10 citations74
US6191034B1Feb 20, 2001
Forming minimal size spaces in integrated circuit conductive lines
ADVANCED MICRO DEVICES INC7 citations73
US6974652B1Dec 13, 2005
Lithographic photomask and method of manufacture to improve photomask test measurement
ADVANCED MICRO DEVICES INC4 citations63
US6749970B2Jun 15, 2004
Method of enhancing clear field phase shift masks with border regions around phase 0 and phase 180 regions
ADVANCED MICRO DEVICES INC4 citations63
US6675369B1Jan 6, 2004
Method of enhancing clear field phase shift masks by adding parallel line to phase 0 region
ADVANCED MICRO DEVICES INC6 citations63
US7543256B1Jun 2, 2009
System and method for designing an integrated circuit device
ADVANCED MICRO DEVICES INC6 citations62
US7071085B1Jul 4, 2006
Predefined critical spaces in IC patterning to reduce line end pull back
ADVANCED MICRO DEVICES INC4 citations61
US7027130B2Apr 11, 2006
Device and method for determining an illumination intensity profile of an illuminator for a lithography system
ADVANCED MICRO DEVICES INC6 citations61
US6818358B1Nov 16, 2004
Method of extending the areas of clear field phase shift generation
ADVANCED MICRO DEVICES INC0 citations52
GLOBALFOUNDRIES INC
2 patentsUS7657864B2Feb 2, 2010
System and method for integrated circuit device design and manufacture using optical rule checking to screen resolution enhancement techniques
GLOBALFOUNDRIES INC5 citations74
US7788609B2Aug 31, 2010
Method and apparatus for optimizing an optical proximity correction model
GLOBALFOUNDRIES INC1 citations52