Inventor
ABADEER WADGI W
US2 patents
Patents
2 patentsUS6844747B2Jan 18, 2005
Wafer level system for producing burn-in/screen, and reliability evaluations to be performed on all chips simultaneously without any wafer contacting
IBM6 citations71
US6909296B2Jun 21, 2005
Wafer level system for producing burn-in/screen, and reliability evaluations to be performed on all chips simultaneously without any wafer contacting
IBM1 citations49