Inventor

NIV ISRAEL

US4 patents

⚠️ This page may combine multiple inventors who share the name “NIV ISRAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

OPAL INC

1 patent

US4941980AJul 17, 1990

System for measuring a topographical feature on a specimen

OPAL INC41 citations84

DCG SYSTEMS INC

1 patent

US10539589B2Jan 21, 2020

Through process flow intra-chip and inter-chip electrical analysis and process control using in-line nanoprobing

DCG SYSTEMS INC7 citations76

CREDENCE SYSTEMS CORP

1 patent

US6956365B2Oct 18, 2005

System and method for calibration of testing equipment using device photoemission

CREDENCE SYSTEMS CORP10 citations71

NIV ISRAEL

1 patent

US8553322B2Oct 8, 2013

Variable magnification optics with spray cooling

NIV ISRAEL4 citations49