Inventor
BUIJSSE BART
NL36 patents
⚠️ This page may combine multiple inventors who share the name “BUIJSSE BART”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FEI CO
29 patentsUS7317515B2Jan 8, 2008
Method of localizing fluorescent markers
FEI CO29 citations92
US7067820B2Jun 27, 2006
Particle-optical apparatus with a permanent-magnetic lens and an electrostatic lens
FEI CO28 citations92
US7064325B2Jun 20, 2006
Apparatus with permanent magnetic lenses
FEI CO20 citations91
US7906762B2Mar 15, 2011
Compact scanning electron microscope
FEI CO25 citations88
US8772716B2Jul 8, 2014
Phase plate for a TEM
FEI CO12 citations84
US11183364B1Nov 23, 2021
Dual beam microscope system for imaging during sample processing
FEI CO7 citations82
US9312098B2Apr 12, 2016
Method of examining a sample in a charged-particle microscope
FEI CO16 citations81
US9129774B2Sep 8, 2015
Method of using a phase plate in a transmission electron microscope
FEI CO10 citations80
US7301157B2Nov 27, 2007
Cluster tool for microscopic processing of samples
FEI CO10 citations80
US7456413B2Nov 25, 2008
Apparatus for evacuating a sample
FEI CO17 citations79
US10651008B2May 12, 2020
Diffraction pattern detection in a transmission charged particle microscope
FEI CO2 citations73
US10545100B2Jan 28, 2020
X-ray imaging technique
FEI CO3 citations72
US7285785B2Oct 23, 2007
Apparatus with permanent magnetic lenses
FEI CO8 citations72
US9865427B2Jan 9, 2018
User interface for an electron microscope
FEI CO2 citations70
US11101101B2Aug 24, 2021
Laser-based phase plate image contrast manipulation
FEI CO3 citations69
US9293297B2Mar 22, 2016
Correlative optical and charged particle microscope
FEI CO2 citations63
US9006652B2Apr 14, 2015
Phase shift method for a TEM
FEI CO2 citations63
US12009176B2Jun 11, 2024
Method and system for generating a diffraction image
FEI CO0 citations62
US11694874B2Jul 4, 2023
Method and system for generating a diffraction image
FEI CO0 citations62
US11456149B2Sep 27, 2022
Methods and systems for acquiring 3D diffraction data
FEI CO0 citations62
US11004655B2May 11, 2021
Diffraction pattern detection in a transmission charged particle microscope
FEI CO0 citations62
US8835846B2Sep 16, 2014
Imaging a sample in a TEM equipped with a phase plate
FEI CO3 citations59
US12306119B2May 20, 2025
Methods and systems for determining the absolute structure of crystal
FEI CO0 citations58
US10935506B2Mar 2, 2021
Method and system for determining molecular structure
FEI CO1 citations58
US11988618B2May 21, 2024
Method and system to determine crystal structure
FEI CO0 citations56
US11815476B2Nov 14, 2023
Methods and systems for acquiring three-dimensional electron diffraction data
FEI CO0 citations55
US9908778B2Mar 6, 2018
Method of producing a freestanding thin film of nano-crystalline graphite
FEI CO1 citations46
US9958403B1May 1, 2018
Arrangement for X-Ray tomography
FEI CO0 citations38
US9583303B2Feb 28, 2017
Aligning a featureless thin film in a TEM
FEI CO0 citations38
BUIJSSE BART
4 patentsUS8093558B2Jan 10, 2012
Environmental cell for a particle-optical apparatus
BUIJSSE BART10 citations83
US8637821B2Jan 28, 2014
Blocking member for use in the diffraction plane of a TEM
BUIJSSE BART5 citations72
US8633456B2Jan 21, 2014
Method for centering an optical element in a TEM comprising a contrast enhancing element
BUIJSSE BART6 citations71
US8658974B2Feb 25, 2014
Environmental cell for a particle-optical apparatus
BUIJSSE BART3 citations61