Inventor

KNOCH JOHN A

US3 patents

⚠️ This page may combine multiple inventors who share the name “KNOCH JOHN A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LSI LOGIC CORP

2 patents

US6512985B1Jan 28, 2003

Process control system

LSI LOGIC CORP24 citations90

US7079966B2Jul 18, 2006

Method of qualifying a process tool with wafer defect maps

LSI LOGIC CORP9 citations62

LSI CORP

1 patent

US7968859B2Jun 28, 2011

Wafer edge defect inspection using captured image analysis

LSI CORP27 citations87