Inventor
ITOH MASAMITSU
JP70 patents
⚠️ This page may combine multiple inventors who share the name “ITOH MASAMITSU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
35 patentsUS5792376AAug 11, 1998
Plasma processing apparatus and plasma processing method
TOSHIBA KK191 citations99
US5188706AFeb 23, 1993
Method of manufacturing an x-ray exposure mask and device for controlling the internal stress of thin films
TOSHIBA KK298 citations99
US6550990B2Apr 22, 2003
Substrate processing apparatus and processing method by use of the apparatus
TOSHIBA KK75 citations98
US6537844B1Mar 25, 2003
Manufacturing method for exposure mask, generating method for mask substrate information, mask substrate, exposure mask, manufacturing method for semiconductor device and server
TOSHIBA KK51 citations96
US6316163B1Nov 13, 2001
Pattern forming method
TOSHIBA KK57 citations96
US7390365B2Jun 24, 2008
Developing method, substrate treating method, and substrate treating apparatus
TOSHIBA KK27 citations93
US7094522B2Aug 22, 2006
Developing method, substrate treating method, and substrate treating apparatus
TOSHIBA KK14 citations93
US7060519B2Jun 13, 2006
Manufacturing method for exposure mask, generating method for mask substrate information, mask substrate, exposure mask, manufacturing method for semiconductor device and server
TOSHIBA KK17 citations93
US6929903B2Aug 16, 2005
Developing method, substrate treating method, and substrate treating apparatus
TOSHIBA KK21 citations93
US6727565B2Apr 27, 2004
Manufacturing method for exposure mask, generating method for mask substrate information, mask substrate, exposure mask, manufacturing method for semiconductor device and server
TOSHIBA KK19 citations93
US7673281B2Mar 2, 2010
Pattern evaluation method and evaluation apparatus and pattern evaluation program
TOSHIBA KK21 citations92
US6649310B2Nov 18, 2003
Method of manufacturing photomask
TOSHIBA KK26 citations92
US6172364B1Jan 9, 2001
Charged particle beam irradiation apparatus
TOSHIBA KK31 citations92
US5909030AJun 1, 1999
Pattern transfer apparatus, an operation management system thereof, and an operation management system for a semiconductor manufacture apparatus
TOSHIBA KK45 citations92
US5907393AMay 25, 1999
Exposure mask and method and apparatus for manufacturing the same
TOSHIBA KK32 citations92
US5728494AMar 17, 1998
Exposure mask and method and apparatus for manufacturing the same
TOSHIBA KK26 citations92
US5629115AMay 13, 1997
Exposure mask and method and apparatus for manufacturing the same
TOSHIBA KK33 citations92
US5166962ANov 24, 1992
X-ray mask, method of manufacturing the same, and exposure method using the same
TOSHIBA KK49 citations92
US8025732B2Sep 27, 2011
Apparatus for processing a substrate
TOSHIBA KK10 citations84
US7435609B2Oct 14, 2008
Manufacturing method for exposure mask, generating method for mask substrate information, mask substrate, exposure mask, manufacturing method for semiconductor device and server
TOSHIBA KK9 citations84
US7313781B2Dec 25, 2007
Image data correction method, lithography simulation method, image data correction system, program, mask and method of manufacturing a semiconductor device
TOSHIBA KK14 citations83
US7479365B2Jan 20, 2009
Semiconductor device manufacturing method
TOSHIBA KK6 citations74
US7384713B2Jun 10, 2008
Exposure mask blank manufacturing method and exposure mask manufacturing method
TOSHIBA KK6 citations74
US7001086B2Feb 21, 2006
Developing method, substrate treating method, and substrate treating apparatus
TOSHIBA KK9 citations74
US5291536AMar 1, 1994
X-ray mask, method for fabricating the same, and pattern formation method
TOSHIBA KK16 citations73
US8658537B2Feb 25, 2014
Mask manufacturing method for nanoimprinting
TOSHIBA KK1 citations63
US8653483B2Feb 18, 2014
Mask manufacturing device
TOSHIBA KK2 citations63
US8584054B2Nov 12, 2013
Photomask manufacturing method and semiconductor device manufacturing method
TOSHIBA KK2 citations63
US7906257B2Mar 15, 2011
Photomask manufacturing method and semiconductor device manufacturing method
TOSHIBA KK4 citations63
US7904851B2Mar 8, 2011
Photomask manufacturing method and semiconductor device manufacturing method
TOSHIBA KK4 citations63
US7703066B2Apr 20, 2010
Exposure mask manufacturing method, drawing apparatus, semiconductor device manufacturing method, and mask blanks product
TOSHIBA KK3 citations63
US7629088B2Dec 8, 2009
Mask defect repairing method and semiconductor device manufacturing method
TOSHIBA KK2 citations63
US7097946B2Aug 29, 2006
Photomask, method of manufacturing a photomask, and method of manufacturing an electronic product
TOSHIBA KK4 citations63
US6204511B1Mar 20, 2001
Electron beam image picturing method and image picturing device
TOSHIBA KK2 citations63
US6660455B2Dec 9, 2003
Pattern formation material, pattern formation method, and exposure mask fabrication method
TOSHIBA KK2 citations62
ITOH MASAMITSU
9 patentsUS8502171B2Aug 6, 2013
Mask manufacturing device
ITOH MASAMITSU4 citations74
US8097539B2Jan 17, 2012
Imprint mask manufacturing method for nanoimprinting
ITOH MASAMITSU5 citations74
US8533634B2Sep 10, 2013
Exposure mask manufacturing method, drawing apparatus, semiconductor device manufacturing method, and mask blanks product
ITOH MASAMITSU3 citations63
US8407629B2Mar 26, 2013
Pattern verification-test method, optical image intensity distribution acquisition method, and computer program
ITOH MASAMITSU2 citations63
US8407628B2Mar 26, 2013
Photomask manufacturing method and semiconductor device manufacturing method
ITOH MASAMITSU3 citations63
US8219942B2Jul 10, 2012
Pattern verification-test method, optical image intensity distribution acquisition method, and computer program
ITOH MASAMITSU2 citations63
US8216744B2Jul 10, 2012
Exposure mask and method for manufacturing same and method for manufacturing semiconductor device
ITOH MASAMITSU4 citations63
US8193100B2Jun 5, 2012
Exposure mask manufacturing method, drawing apparatus, semiconductor device manufacturing method, and mask blanks product
ITOH MASAMITSU3 citations63
US8189903B2May 29, 2012
Photomask evaluation based on lithographic simulation using sidewall angle of photomask pattern
ITOH MASAMITSU4 citations63
NAT TAX ADMINISTRATION AGENCY
2 patentsYONEDA IKUO
1 patentDAINIPPON PRINTING CO LTD
1 patentSHINETSU CHEMICAL CO
1 patentKANAMITSU SHINGO
1 patentShowing the top 50 of 70 patents by PatentIndex Score.