Inventor
KOENEMANN BERND K F
US4 patents
Patents
4 patentsUS5612963AMar 18, 1997
Hybrid pattern self-testing of integrated circuits
IBM108 citations96
US5617426AApr 1, 1997
Clocking mechanism for delay, short path and stuck-at testing
IBM32 citations90
US5375091ADec 20, 1994
Method and apparatus for memory dynamic burn-in and test
IBM23 citations90
US7435990B2Oct 14, 2008
Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer
IBM7 citations72