Inventor
NAGASHIGE KENICHI
JP16 patents
⚠️ This page may combine multiple inventors who share the name “NAGASHIGE KENICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJITSU LTD
13 patentsUS6218281B1Apr 17, 2001
Semiconductor device with flip chip bonding pads and manufacture thereof
FUJITSU LTD162 citations98
US6455920B2Sep 24, 2002
Semiconductor device having a ball grid array and a fabrication process thereof
FUJITSU LTD72 citations96
US7112889B1Sep 26, 2006
Semiconductor device having an alignment mark formed by the same material with a metal post
FUJITSU LTD36 citations92
US7064047B2Jun 20, 2006
Semiconductor device having a ball grid array and a fabrication process thereof
FUJITSU LTD16 citations92
US6987054B2Jan 17, 2006
Method of fabricating a semiconductor device having a groove formed in a resin layer
FUJITSU LTD12 citations92
US6784542B2Aug 31, 2004
Semiconductor device having a ball grid array and a fabrication process thereof
FUJITSU LTD15 citations92
US6657282B2Dec 2, 2003
Semiconductor device having a ball grid array and a fabrication process thereof
FUJITSU LTD19 citations92
US6563330B1May 13, 2003
Probe card and method of testing wafer having a plurality of semiconductor devices
FUJITSU LTD37 citations92
US6511620B1Jan 28, 2003
Method of producing semiconductor devices having easy separability from a metal mold after molding
FUJITSU LTD35 citations92
US6471501B1Oct 29, 2002
Mold for fabricating semiconductor devices
FUJITSU LTD53 citations92
US6469370B1Oct 22, 2002
Semiconductor device and method of production of the semiconductor device
FUJITSU LTD54 citations92
US6437432B2Aug 20, 2002
Semiconductor device having improved electrical characteristics and method of producing the same
FUJITSU LTD30 citations92
US6774650B2Aug 10, 2004
Probe card and method of testing wafer having a plurality of semiconductor devices
FUJITSU LTD7 citations73