Inventor
HASEGAWA MASATOMO
JP18 patents
⚠️ This page may combine multiple inventors who share the name “HASEGAWA MASATOMO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJITSU LTD
15 patentsUS6172537B1Jan 9, 2001
Semiconductor device
FUJITSU LTD86 citations98
US6628564B1Sep 30, 2003
Semiconductor memory device capable of driving non-selected word lines to first and second potentials
FUJITSU LTD63 citations96
US6605963B2Aug 12, 2003
Semiconductor integrated circuit and method of switching source potential of transistor in semiconductor integrated circuit
FUJITSU LTD65 citations96
US6229363B1May 8, 2001
Semiconductor device
FUJITSU LTD69 citations96
US5671239ASep 23, 1997
Semiconductor memory of xN type having error correcting circuit by parity
FUJITSU LTD69 citations96
US7079443B2Jul 18, 2006
Semiconductor device
FUJITSU LTD18 citations92
US6618320B2Sep 9, 2003
Semiconductor memory device
FUJITSU LTD46 citations92
US6201378B1Mar 13, 2001
Semiconductor integrated circuit
FUJITSU LTD36 citations92
US6198686B1Mar 6, 2001
Memory device having row decoder
FUJITSU LTD25 citations92
US6072749AJun 6, 2000
Memory device preventing a slow operation through a mask signal
FUJITSU LTD19 citations84
US6252269B1Jun 26, 2001
Semiconductor memory device
FUJITSU LTD8 citations74
US6115284ASep 5, 2000
Memory device with faster write operation
FUJITSU LTD9 citations74
US6111795AAug 29, 2000
Memory device having row decoder
FUJITSU LTD11 citations74
US6147919ANov 14, 2000
Semiconductor memory employing direct-type sense amplifiers capable of realizing high-speed access
FUJITSU LTD13 citations73
US6246628B1Jun 12, 2001
Semiconductor memory device having read/write amplifiers disposed for respective memory segments
FUJITSU LTD2 citations62
SHARP KK
2 patentsUS7567128B2Jul 28, 2009
Power amplifier suppressing radiation of second harmonic over wide frequency band
SHARP KK14 citations84
US7733105B2Jun 8, 2010
Voltage clamp circuit and semiconductor device, overcurrent protection circuit, voltage measurement probe, voltage measurement device and semiconductor evaluation device respectively using the same
SHARP KK3 citations61