Inventor
KOBAYASHI SHINTARO
JP38 patents
⚠️ This page may combine multiple inventors who share the name “KOBAYASHI SHINTARO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HOYA CORP
9 patentsUS11701633B2Jul 18, 2023
Powder, method of producing powder and adsorption apparatus
HOYA CORP1 citations73
US11278864B2Mar 22, 2022
Powder, method of producing powder and adsorption apparatus
HOYA CORP1 citations73
US11161090B2Nov 2, 2021
Powder, method of producing powder and adsorption apparatus
HOYA CORP2 citations73
US10710050B2Jul 14, 2020
Powder, method of producing powder, and adsorption apparatus
HOYA CORP3 citations73
US12161988B2Dec 10, 2024
Powder, method of producing powder and adsorption apparatus
HOYA CORP0 citations62
US7727497B2Jun 1, 2010
Method for producing particles, particles, and sintered body
HOYA CORP2 citations60
US7837872B2Nov 23, 2010
Adsorbent, adsorption apparatus, and method for manufacturing the adsorption apparatus
HOYA CORP3 citations56
US7919432B2Apr 5, 2011
Adsorbent, adsorption apparatus, and method for manufacturing the adsorption apparatus
HOYA CORP0 citations42
US7767179B2Aug 3, 2010
Method for producing adsorbent, adsorbent, and adsorption apparatus
HOYA CORP0 citations38
RIGAKU DENKI CO LTD
7 patentsUS10964439B2Mar 30, 2021
Soller slit, X-ray diffraction apparatus, and method
RIGAKU DENKI CO LTD2 citations71
US11221423B2Jan 11, 2022
Processing apparatus, sysyem, X-ray measurement method, and program
RIGAKU DENKI CO LTD2 citations63
US11788974B2Oct 17, 2023
Control apparatus, system, method, and program
RIGAKU DENKI CO LTD1 citations60
US10585053B2Mar 10, 2020
X-ray diffractometer
RIGAKU DENKI CO LTD0 citations51
US10837923B2Nov 17, 2020
X-ray analysis device and method for optical axis alignment thereof
RIGAKU DENKI CO LTD0 citations50
US10444168B2Oct 15, 2019
Method and apparatus for measuring bowing of single-crystal substrate
RIGAKU DENKI CO LTD0 citations39
US9322792B2Apr 26, 2016
X-ray diffraction apparatus and method of measuring X-ray diffraction
RIGAKU DENKI CO LTD0 citations39
CATALER CORP
6 patentsUS10286392B2May 14, 2019
Exhaust gas purification catalyst
CATALER CORP7 citations84
US11118495B2Sep 14, 2021
Exhaust gas-purifying system and automotive vehicle
CATALER CORP2 citations72
US9981223B2May 29, 2018
Exhaust gas purification apparatus
CATALER CORP1 citations52
US10335736B2Jul 2, 2019
Exhaust gas purification material
CATALER CORP0 citations41
US10029209B2Jul 24, 2018
Exhaust gas purification material
CATALER CORP0 citations41
US10344641B2Jul 9, 2019
Exhaust gas purifying catalyst
CATALER CORP0 citations39
KOMATSU MFG CO LTD
5 patentsUS9644341B2May 9, 2017
Motor grader
KOMATSU MFG CO LTD13 citations84
US10759337B2Sep 1, 2020
Work vehicle
KOMATSU MFG CO LTD1 citations62
US10745873B2Aug 18, 2020
Work vehicle
KOMATSU MFG CO LTD1 citations62
US12084838B2Sep 10, 2024
Work machine and method of controlling the same
KOMATSU MFG CO LTD0 citations51
US11873623B2Jan 16, 2024
Work machine and method of controlling the same
KOMATSU MFG CO LTD0 citations51
SHIMIZU CONSTRUCTION CO LTD
4 patentsUS4867629ASep 19, 1989
Dusttight storage cabinet apparatus for use in clean rooms
SHIMIZU CONSTRUCTION CO LTD431 citations98
US4781511ANov 1, 1988
Semiconductor processing system
SHIMIZU CONSTRUCTION CO LTD406 citations98
US4826360AMay 2, 1989
Transfer system in a clean room
SHIMIZU CONSTRUCTION CO LTD110 citations96
US4904153AFeb 27, 1990
Transporting robot for semiconductor wafers
SHIMIZU CONSTRUCTION CO LTD70 citations95
OLYMPUS CORP
3 patentsUS10222598B2Mar 5, 2019
Inverted microscope and light blocking device for inverted microscope
OLYMPUS CORP3 citations72
US10274713B2Apr 30, 2019
Microscope including a white light emitting diode and a light shielding member that can prevent excitation light from reaching the white light emitting diode
OLYMPUS CORP3 citations70
US10317658B2Jun 11, 2019
Microscope system and correction collar operating device
OLYMPUS CORP1 citations60