Inventor

HAN YOU-KEUN

KR17 patents

⚠️ This page may combine multiple inventors who share the name “HAN YOU-KEUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HAN YOU-KEUN

SAMSUNG ELECTRONICS CO LTD

Memory modules and memory systems having the same

Methods and apparatus for interfacing between test system and memory

Method of testing a memory module and hub of the memory module

Memory module testing apparatus and method of testing memory modules

Method of testing a memory module and hub of the memory module

Method of testing a memory module and hub of the memory module

Semiconductor memory module and semiconductor memory device

Memory module packaging test system

Memory module, memory unit, and hub with non-periodic clock and methods of using the same

Memory module and memory system comprising same

Memory device and memory system including the same

KIM SEOK-IL

Memory module cutting off DM pad leakage current

Memory module and memory system comprising memory module

Semiconductor devices including design for test capabilities and semiconductor modules and test systems including such devices

Address transforming circuit and semiconductor memory device including the same

Memory module cutting off DM pad leakage current

JANG SOON-DEOK

Memory module including memory buffer and memory system having the same