Inventor

HOSHII TAKUYA

JP2 patents

Patents

2 patents

US11513149B2Nov 29, 2022

Method for evaluating electrical defect density of semiconductor layer, and semiconductor element

SUMITOMO CHEMICAL CO0 citations58

US11652150B2May 16, 2023

Charge trap evaluation method and semiconductor element

SUMITOMO CHEMICAL CO0 citations47