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Inventor
WAAYERS THOMAS F
NL
2 patents
⚠️ This page may combine multiple inventors who share the name “WAAYERS THOMAS F”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NXP BV
1 patent
US7620866B2
Nov 17, 2009
Test access architecture and method of testing a module in an electronic circuit
NXP BV
21 citations
86
WAAYERS THOMAS F
1 patent
US8410787B2
Apr 2, 2013
Testing of an integrated circuit with a plurality of clock domains
WAAYERS THOMAS F
2 citations
48