Inventor

LIU WENWEI

CN6 patents

⚠️ This page may combine multiple inventors who share the name “LIU WENWEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNIV NANKAI

2 patents

US11543564B2Jan 3, 2023

Metalens array and spatial positioning method based on metalens array

UNIV NANKAI1 citations55

US10459127B2Oct 29, 2019

Fourier lens, method for designing Fourier lens, and schlieren apparatus

UNIV NANKAI0 citations37

CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON

1 patent

US12079550B1Sep 3, 2024

Wiener process-based method and device for processing accelerated degradation testing data

CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON1 citations53

CHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES

1 patent

US12124248B1Oct 22, 2024

Method and apparatus for processing accelerated test data based on multiple performance degradation, and computer device

CHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES0 citations42

CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RES INSTITUTE THE FIFTH ELECTRONIC IN

1 patent

US11247331B2Feb 15, 2022

Static compliance performance testing device applied to industrial robot

CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RES INSTITUTE THE FIFTH ELECTRONIC IN0 citations38

CHINA ELECTRONICS RELIABILITY AND ENVIRONMENTAL TESTING INSTITUTE THE FIFTH INSTITUTE OF ELECTRONICS

1 patent

US11660745B2May 30, 2023

Industrial robot motion accuracy compensation method and system, and computer device

CHINA ELECTRONICS RELIABILITY AND ENVIRONMENTAL TESTING INSTITUTE THE FIFTH INSTITUTE OF ELECTRONICS0 citations33