Inventor
SHIGENO MASATSUGU
JP26 patents
⚠️ This page may combine multiple inventors who share the name “SHIGENO MASATSUGU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SII NANOTECHNOLOGY INC
7 patentsUS7973942B2Jul 5, 2011
Optical displacement detection mechanism and surface information measurement device using the same
SII NANOTECHNOLOGY INC13 citations84
US7170054B2Jan 30, 2007
Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder
SII NANOTECHNOLOGY INC12 citations83
US7945965B2May 17, 2011
Sensor for observations in liquid environments and observation apparatus for use in liquid environments
SII NANOTECHNOLOGY INC2 citations62
US7614288B2Nov 10, 2009
Scanning probe microscope fine-movement mechanism and scanning probe microscope using same
SII NANOTECHNOLOGY INC3 citations62
US7605368B2Oct 20, 2009
Vibration-type cantilever holder and scanning probe microscope
SII NANOTECHNOLOGY INC6 citations62
US7375322B2May 20, 2008
Cantilever holder and scanning probe microscope
SII NANOTECHNOLOGY INC2 citations60
US7026607B2Apr 11, 2006
Scanning probe microscope
SII NANOTECHNOLOGY INC2 citations60
HITACHI HIGH TECH SCIENCE CORP
7 patentsUS11391755B2Jul 19, 2022
Scanning probe microscope and setting method thereof
HITACHI HIGH TECH SCIENCE CORP0 citations60
US10837982B2Nov 17, 2020
Scanning probe microscope and scanning method using the same
HITACHI HIGH TECH SCIENCE CORP0 citations52
US9354248B2May 31, 2016
Method for measuring vibration characteristic of cantilever
HITACHI HIGH TECH SCIENCE CORP0 citations51
US10345335B2Jul 9, 2019
Scanning probe microscope and scanning method thereof
HITACHI HIGH TECH SCIENCE CORP0 citations42
US10161958B2Dec 25, 2018
Three-dimensional fine movement device
HITACHI HIGH TECH SCIENCE CORP0 citations42
US10151773B2Dec 11, 2018
Scanning probe microscope and probe contact detection method
HITACHI HIGH TECH SCIENCE CORP0 citations41
US9921241B2Mar 20, 2018
Scanning probe microscope and measurement range adjusting method for scanning probe microscope
HITACHI HIGH TECH SCIENCE CORP0 citations40
SEIKO INSTR INC
4 patentsUS7456400B2Nov 25, 2008
Scanning probe microscope and scanning method
SEIKO INSTR INC7 citations72
US7861577B2Jan 4, 2011
Electric potential difference detection method and scanning probe microscope
SEIKO INSTR INC6 citations63
US7823470B2Nov 2, 2010
Cantilever and cantilever manufacturing method
SEIKO INSTR INC3 citations62
US7580125B2Aug 25, 2009
Liquid cell
SEIKO INSTR INC0 citations42
SHIGENO MASATSUGU
3 patentsUS8214915B2Jul 3, 2012
Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever
SHIGENO MASATSUGU4 citations60
US8615811B2Dec 24, 2013
Method of measuring vibration characteristics of cantilever
SHIGENO MASATSUGU3 citations59
US8719959B2May 6, 2014
Cantilever, cantilever system, and probe microscope and adsorption mass sensor including the cantilever system
SHIGENO MASATSUGU1 citations50