P

Inventor

SHIKAKURA YOSHITERU

JP11 patents
⚠️ This page may combine multiple inventors who share the name “SHIKAKURA YOSHITERU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SII NANOTECHNOLOGY INC

4 patents
US8024816B2Sep 20, 2011

Approach method for probe and sample in scanning probe microscope

SII NANOTECHNOLOGY INC13 citations83
US7284415B2Oct 23, 2007

Scanning probe microscope

SII NANOTECHNOLOGY INC5 citations61
US7997124B2Aug 16, 2011

Scanning probe microscope

SII NANOTECHNOLOGY INC0 citations51
US7442925B2Oct 28, 2008

Working method using scanning probe

SII NANOTECHNOLOGY INC0 citations49

HITACHI HIGH TECH SCIENCE CORP

4 patents
US11391755B2Jul 19, 2022

Scanning probe microscope and setting method thereof

HITACHI HIGH TECH SCIENCE CORP0 citations60
US9354248B2May 31, 2016

Method for measuring vibration characteristic of cantilever

HITACHI HIGH TECH SCIENCE CORP0 citations51
US9921241B2Mar 20, 2018

Scanning probe microscope and measurement range adjusting method for scanning probe microscope

HITACHI HIGH TECH SCIENCE CORP0 citations40
US10712363B2Jul 14, 2020

Scanning probe microscope

HITACHI HIGH TECH SCIENCE CORP0 citations39

SEIKO INSTR INC

1 patent
US6596992B2Jul 22, 2003

Method of operating scanning probe microscope

SEIKO INSTR INC12 citations69

SHIGENO MASATSUGU

1 patent
US8615811B2Dec 24, 2013

Method of measuring vibration characteristics of cantilever

SHIGENO MASATSUGU3 citations59

WAKIYAMA SHIGERU

1 patent
US8495759B2Jul 23, 2013

Probe aligning method for probe microscope and probe microscope operated by the same

WAKIYAMA SHIGERU2 citations54